常素萍｜华中科技大学｜学者主页

2026

Simultaneous Measurement of Thin-Film Thickness and Group Refractive Index Using Vertical Scanning White-Light Interferometry

Qing Zhou, Yun-Quan Wu, Zhichen Cao, Tong Wang, Tian-Wei Zhang, Suping Chang, Wen-Long Lu

IEEE Transactions on Instrumentation and Measurement

DOI

2026

Divided-pupil hybrid configuration for accuracy enhancement in line-scanning chromatic confocal measurement

Jiacheng Dai, Qin-Yang Li, Wen-Long Lu, Xiang-Qian Jiang, Suping Chang

Optics & Laser Technology

DOI

2025

基于深度学习的保偏光纤轴向残余应力稀疏投影重建

张国庆，常素萍，茅昕，王国强，刘尚军，卢文龙

《仪表技术与传感器》

2025

光强—波长模型和RBFN相融合的光谱共焦信号峰值提取方法

周鹏，吴运权，彭秋然，常素萍，卢文龙

《中国测试》

2025

基于电磁力的气浮触针位移传感器动态参数调控方法研究

祁博洋，常素萍，张国庆，刘尚军

《仪表技术与传感器》

2025

Sub-micron precision enhancement of chromatic confocal sensors based on robust centroid algorithms

Jiacheng Dai, Yun-Quan Wu, Suping Chang, Wen-Long Lu

The International Conference Optoelectronic Information and Optical Engineering

DOI

2025

Enhancing Accuracy of Line-Structured Light Sensor for Narrow Weld Gap Measurement

C. Xi, Shangjun Liu, Suping Chang, Yang Dong, Wenbin Zhong, Xiang-Qian Jiang, Wen-Long Lu

IEEE Transactions on Instrumentation and Measurement

DOI

2024

基于交叉变异PSO算法的形貌测量系统误差补偿

王浩，常素萍，张国庆，祁博洋

《工具技术》

2024

基于光弹法的光纤轴向残余应力检测研究

张国庆，常素萍，茅昕，卢文龙

《仪表技术与传感器》

2023

Measurement of thickness and refractive index of transparent material synchronously based on chromatic confocal sensor.

Yun-Quan Wu, Suping Chang, W. Zeng, Xiang-Qian Jiang, Wen-Long Lu

Optics Express

DOI

2021

基于Nelder–Mead单纯形法的杠杆式触针轮廓仪非线性误差补偿

孙艳玲，吴运权，李波，常素萍

《中国测试》

2021

气浮支承式触针测量系统径向动态性能研究

吴运权，常素萍，吴昊

《航空制造技术》

2021

Design and characteristics of a new aerostatic bearing stylus sensor for surface measurement

Hao Wu, Shu-Ting Wang, Yuan-Long Xie, Suping Chang, Yan-Qin Zhao

DOI

2019

Analysis of contacting characteristics on aerostatic bearing stylus displacement sensor

Hao Wu, Suping Chang, Jian-Fei Zhou, Chunbing Hu, Zhongyu Zhang

International Symposium on Precision Engineering Measurement and Instrumentation

DOI

2019

Dynamic characteristics of air bearing stylus surface topography measuring sensor

Hao Wu, Suping Chang, Wen-Long Lu, Yan-Qin Zhao

2019

Control circuit design of magnetic suspension stylus measuring instrument

周建飞，Suping Chang，Chunbing Hu，Hao Wu，Zhongyu Zhang

International Symposium on Precision Engineering Measurement and Instrumentation

DOI

2018

Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy

Chi Hu, Xiaojun Liu, Wen-Jun Yang, Wenlong Lu, Neng-Hai Yu, Suping Chang

DOI

2017

A Novel White Light Interference Based AFM Head

Wen-Jun Yang, Xiaojun Liu, Wenlong Lu, Neng-Hai Yu, Liang-Zhou Chen, Li-Ping Zhou, Suping Chang

Journal of Lightwave Technology

DOI

2017

Error analysis and correction of lever-type stylus profilometer based on Nelder-Mead Simplex method

Chunbing Hu, Suping Chang, B. Li, Junwei Wang, Zhongyu Zhang

Applied Optics and Photonics China

DOI

2016

接触式表面轮廓测量的非线性误差分析与补偿

孙艳玲，常素萍

《计量学报》

2016

A novel surface recovery algorithm in white light interferometry

Zi-Li Lei, Xiaojun Liu, Liang-Zhou Chen, Wenlong Lu, Suping Chang

DOI

2016

Design on electromagnetic actuator of aerostatic bearing stylus displacement sensor

Junwei Wang, Suping Chang, Xiaojun Liu, Wenlong Lu, Yan-Ling Sun, Chunbing Hu

International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT)

DOI

2015

接触式表面轮廓测量仪的非线性误差分析与补偿

孙艳玲，梁煜恒，常素萍

《计量科学与技术》

2015

A surface, atomic force ccd line scanning probe measurement system and measurement method combined

Wenlong Lu, Neng-Hai Yu, Xiaojun Liu, Wen-Jun Yang, Suping Chang, Chun-Yang Zeng

2015

Multifunction surface measurement system based on focusing optical stylus interference and confocal image

F. Lin, Shu-Zhong Zhao, Suping Chang, Yan-Ling Sun, T. Xie

Precision Engineering Measurements and Instrumentation

DOI

2014

毛化表面的三维表面形貌在线测量仪

辛洪，常素萍，谢铁邦

《计量科学与技术》

2014

Multifunction surface topography measurement system based on white-light interference

T. Xie, Xiaojun Liu, Suping Chang, Shu-Zhen Wang

2014

An Online Measuring Instrument for the Surface Topography of Texturing Surfaces

Hong Xin, Suping Chang, T. Xie

2012

Multi-probe flatness detector and flatness detection method

Wen-Long Lu, Suping Chang, Sheng-Huai Wang, T. Xie, Yu-Rong Chen

2011

复合型超精密表面形貌测量仪

王淑珍，谢铁邦，常素萍

《光学精密工程》

2011

A white light interference-based atomic force probe scanning microscopy

Shu-Zhen Wang, T. Xie, Suping Chang

DOI

2011

Non-uniform interpolation and re-sampling for tactile scanning measurement

Xiaojun Liu, Yong-Ping Hei, Jian-Jun Wang, Suping Chang

International Symposium on Precision Engineering Measurement and Instrumentation

DOI

2011

A controlled-force laser interference profilometer

Bo Yang, Suping Chang, T. Xie, W. Pan

International Symposium on Precision Engineering Measurement and Instrumentation

DOI

2011

Combined profilometer for ultra-precision surface topography

Shu-Zhen Wang, T. Xie, Suping Chang

DOI

2010

大行程纳米级共平面二维精密工作台的研究

王淑珍，常素萍，谢铁邦

《机械科学与技术》

2010

Scanning white-light interferometric measurement of free form surface based on interference fringe tracing

Suping Chang, Shu-Zhen Wang, T. Xie, W. Pan

International Symposium on Precision Engineering Measurement and Instrumentation

DOI

2010

Vertical scanning white light interfering profilometer based on Linnik interference microscope

Shu-Zhen Wang, T. Xie, Suping Chang

International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT)

DOI

2010

Design and realization of controllable measuring force profilometer

W. Pan, Shu-Zhen Wang, Suping Chang

International Symposium on Precision Engineering Measurement and Instrumentation

DOI

2009

一种新型弹头痕迹测量仪

王淑珍，谢铁邦，常素萍

《兵工自动化》

2009

A novel contact and non-contact hybrid profilometer

Jian-Ping Yun, Suping Chang, T. Xie, Ling-Ling Zhang, Guo Hu

DOI

2009

White light interference profile meter

Xiaojun Liu, Suping Chang, Shu-Zhen Wang, Sheng-Huai Wang, T. Xie

2008

透明薄膜的干涉相干峰分离算法

常素萍，谢铁邦

《光学技术》

2008

基于垂直扫描显微干涉技术的高精度轮廓仪(英文)

戴蓉，谢铁邦，龚文，常素萍

Advances in Manufacturing

2008

A high precision profilometer based on vertical scanning microscopic interferometry

R. Dai, T. Xie, W. Gong, Suping Chang

DOI

2008

A novel 3D profilometer based on linear phase grating interference

Shu-Zhen Wang, T. Xie, Suping Chang, S. Cui

International Symposium on Precision Mechanical Measurements

DOI

2007

基于白光干涉的MEMS三维表面形貌测量

常素萍，谢铁邦

《华中科技大学学报(自然科学版)》

2007

基于白光干涉轮廓尺寸与形貌非接触测量方法和系统

常素萍

《华中科技大学》

2007

Applied research on four-quadrant optoelectronic detector for surface topography measurement

Shu-Zhen Wang, Suping Chang, T. Xie, Xuan-Ze Wang

International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT)

DOI

2007

A Contact and Non-Contact Hybrid Profilometer with Large Range

Jian-Ping Yun, Xu-Dong Yang, T. Xie, Suping Chang

DOI

2007

A Scanning White-Light Interferometric Profilometer for Smooth and Rough Surface

R. Dai, T. Xie, Suping Chang

DOI

2007

Absolute Measurement of Aspheric Surfaces Using White-Light Interferometry

Suping Chang, T. Xie, Xuang-Ze Wang, Jun Guo

DOI

2006

钢球表面粗糙度的白光干涉非接触测量法

常素萍，谢铁邦

《轴承》

2006

WI VS三维表面形貌测量仪

常素萍，谢铁邦

《计量科学与技术》

2006

垂直扫描白光干涉表面三维形貌测量系统

戴蓉，谢铁邦，常素萍

《光学技术》

2006

Vertical displacement stage with diffraction grating sensor

Suping Chang, T. Xie, R. Dai

International Symposium on Instrumentation and Control Technology

DOI

2006

White-light interferometric measurement of spherical and aspherical surfaces

Suping Chang, T. Xie

International Symposium on Precision Mechanical Measurements

DOI

2005

A micro-displacement stage for scanning white-light interferometry

R. Dai, T. Xie, Suping Chang

DOI

2005

High-precision non-contact profile measurement for spherical surfaces and aspherical surfaces

Suping Chang, T. Xie, R. Dai, Gang Xiao

DOI

Enhancing precision in line-scan chromatic confocal sensors through bimodal signal pattern

Jiacheng Dai, Wenbin Zhong, W. Zeng, Xiang-Qian Jiang, Suping Chang, Wen-Long Lu

Optics & Laser Technology

DOI

精选作品

期刊论文

Simultaneous Measurement of Thin-Film Thickness and Group Refractive Index Using Vertical Scanning White-Light Interferometry

Divided-pupil hybrid configuration for accuracy enhancement in line-scanning chromatic confocal measurement

基于深度学习的保偏光纤轴向残余应力稀疏投影重建

光强—波长模型和RBFN相融合的光谱共焦信号峰值提取方法

基于电磁力的气浮触针位移传感器动态参数调控方法研究

Sub-micron precision enhancement of chromatic confocal sensors based on robust centroid algorithms

Enhancing Accuracy of Line-Structured Light Sensor for Narrow Weld Gap Measurement

基于交叉变异PSO算法的形貌测量系统误差补偿

基于光弹法的光纤轴向残余应力检测研究

Measurement of thickness and refractive index of transparent material synchronously based on chromatic confocal sensor.

基于Nelder–Mead单纯形法的杠杆式触针轮廓仪非线性误差补偿

气浮支承式触针测量系统径向动态性能研究

Design and characteristics of a new aerostatic bearing stylus sensor for surface measurement

Analysis of contacting characteristics on aerostatic bearing stylus displacement sensor

Dynamic characteristics of air bearing stylus surface topography measuring sensor

Control circuit design of magnetic suspension stylus measuring instrument

Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy

A Novel White Light Interference Based AFM Head

Error analysis and correction of lever-type stylus profilometer based on Nelder-Mead Simplex method

接触式表面轮廓测量的非线性误差分析与补偿

A novel surface recovery algorithm in white light interferometry

Design on electromagnetic actuator of aerostatic bearing stylus displacement sensor

接触式表面轮廓测量仪的非线性误差分析与补偿

A surface, atomic force ccd line scanning probe measurement system and measurement method combined

Multifunction surface measurement system based on focusing optical stylus interference and confocal image

毛化表面的三维表面形貌在线测量仪

Multifunction surface topography measurement system based on white-light interference

An Online Measuring Instrument for the Surface Topography of Texturing Surfaces

Multi-probe flatness detector and flatness detection method

复合型超精密表面形貌测量仪

A white light interference-based atomic force probe scanning microscopy

Non-uniform interpolation and re-sampling for tactile scanning measurement

A controlled-force laser interference profilometer

Combined profilometer for ultra-precision surface topography

大行程纳米级共平面二维精密工作台的研究

Scanning white-light interferometric measurement of free form surface based on interference fringe tracing

Vertical scanning white light interfering profilometer based on Linnik interference microscope

Design and realization of controllable measuring force profilometer

一种新型弹头痕迹测量仪

A novel contact and non-contact hybrid profilometer

White light interference profile meter

透明薄膜的干涉相干峰分离算法

基于垂直扫描显微干涉技术的高精度轮廓仪(英文)

A high precision profilometer based on vertical scanning microscopic interferometry

A novel 3D profilometer based on linear phase grating interference

基于白光干涉的MEMS三维表面形貌测量

基于白光干涉轮廓尺寸与形貌非接触测量方法和系统

Applied research on four-quadrant optoelectronic detector for surface topography measurement

A Contact and Non-Contact Hybrid Profilometer with Large Range

A Scanning White-Light Interferometric Profilometer for Smooth and Rough Surface

Absolute Measurement of Aspheric Surfaces Using White-Light Interferometry

钢球表面粗糙度的白光干涉非接触测量法

WI VS三维表面形貌测量仪

垂直扫描白光干涉表面三维形貌测量系统

Vertical displacement stage with diffraction grating sensor

White-light interferometric measurement of spherical and aspherical surfaces

A micro-displacement stage for scanning white-light interferometry

High-precision non-contact profile measurement for spherical surfaces and aspherical surfaces

Enhancing precision in line-scan chromatic confocal sensors through bimodal signal pattern

研究方向