Influenceofelectrical2026Influence of electrical stress on total dose radiation effect of the strained Si nano NMOSFETMinru Hao, Jiajun Li, Yuchen Wang, danting chen, hua wu, Zhifan Wen, Chenxiang Zhang, Yanjie WangEngineering Research ExpressDOI
Study2025Study on the reinforcement structure of strained silicon MOS under single event effect and its application in inverter chainsMinru Hao, Yuchen Wang, Danting Chen, Jiajun Li, Qian ZhangRadiation effects and defects in solidsDOI
Study onStreng-thening2024Study on Strengthening Structure of Single Event EffectMinru Hao, Yuchen Wang, Danting Chen, Jiajun LiResearch SquareDOI
GeComposi-tion2026Ge Composition Modulation of NBTI-TID Coupling Effects in Strained SiGe PMOSFETsMinru Hao, 艺哲 张, danting chenMendeley DataDOI