董敬涛｜合肥工业大学｜学者主页

2026

Dark-field differential confocal microscopy for three-dimensional detection of subsurface defects

Yuhua Zhuo, Mingxiang Chen, Chuanlong Wang, Chao Song, Wei Shi, Jingtao Dong

Measurement

DOI

2026

High-resolution spiral phase contrast microscope: From Fourier filtering to match filtering

Jingtao Dong, Yingjun Cheng, Qingcheng Wu, Linjie He, Yunlong Du, Rongsheng Lu, Xinglong Xie

APL Photonics

DOI

2025

基于点到线共焦的暗场激光散射表面缺陷检测

常凯，王硕，程莹钧，田志彭，卢荣胜，谢兴龙，董敬涛

《激光与光电子学进展》

2025

基于多普勒效应的载波涡旋干涉动态位移测量

Yang-Yang Li, Li-Yuan Xie, R. Lu, Xiu-Yong Yang, Jingtao Dong

Acta Optica Sinica

DOI

2025

Steady-state thermal lens strength detection via thermally induced diffraction effect

Jingtao Dong, Zexun Liu, Shuo Wang, Yu Chen, Huan Liu, Mengyuan Zhu, Rui Gong, Jianhua Zhao, Yi Luo

Optics & Laser Technology

DOI

2025

Stabilizing Orthogonal Phase Bias of Mach–Zehnder Interferometer via Dual-Wavelength Feedback and Geometric Phase Shifter

Zhipeng Tian, Siyuan Lou, Ang Wu, Rongsheng Lu, Yuan Lu, Jingtao Dong

IEEE Transactions on Instrumentation and Measurement

DOI

2024

Quantitative detection of weak scratches of optical elements based on image segmentation and connection of broken scratches

Shuo Wang, Yingjun Cheng, Yuhua Zhuo, Jingtao Dong

Optics Communications

DOI

2024

The detection of elemental content changes in electrode coating using laser-induced breakdown spectroscopy

Lei Yang, Yinchuan Li, Congyuan Pan, Wenyi Bao, Lei Qin, Jingtao Dong, Mengjie Xu, Feng Ji, Yuzhong Zhang, Rongsheng Lu

Spectrochimica Acta Part B Atomic Spectroscopy

DOI

2024

Optical vortex interferometer: An overview of interferogram demodulation methods for dynamic phase measurement

Jingtao Dong, Enxi Zhao, Liyuan Xie, Yangyang Li, Zhipeng Tian, Xinglong Xie

Optics and Lasers in Engineering

DOI

2024

Spectral correction study to reduce the influence of sample surface morphology on laser-induced breakdown spectroscopy

Yong Xiang, Lei Yang, Xuanchen Li, Wenteng Sun, Congyuan Pan, Jingtao Dong, Mengjie Xu, Jingjing Chen, Rongsheng Lu

Journal of Analytical Atomic Spectrometry

DOI

2023

Dark-field line confocal imaging with point confocality and extended line field for bulk defects detection

Jingtao Dong, Tengda Zhang, Lei Yang, Yuzhong Zhang, Rongsheng Lu, Xinglong Xie

Chinese Optics Letters

DOI

2023

Photothermal vortex interferometer with azimuthal complex spectra analysis for the measurement of laser-induced nanoscale thermal lens dynamics

Jingtao Dong, Tengda Zhang, Lei Yang, Yuzhong Zhang, Rongsheng Lu, Xinglong Xie

Review of Scientific Instruments

DOI

2023

Three-dimensional measurement of laser-induced thermal mirror dynamics using photothermal vortex interferometer with azimuthal phase spectra analysis

Jingtao Dong, Yangyang Li, Enxi Zhao, Liyuan Xie, Zhipeng Tian, Xinglong Xie

Measurement

DOI

2023

Dynamic surface displacement measurement using carrier optical vortex interferometer: A numerical study

Jingtao Dong, Helia Hooshmand, Mingyu Liu, Samanta Piano

Optics and Lasers in Engineering

DOI

2023

Carrier optical vortex interferometer using segmentation demodulation method for dynamic measurement of axisymmetric surface deformation

Jingtao Dong, Liyuan Xie, Shuo Wang, Enxi Zhao, Yangyang Li, Zhipeng Tian

Review of Scientific Instruments

DOI

2023

Identification and classification of recyclable waste using laser-induced breakdown spectroscopy technology

Lei Yang, Yong Xiang, Yinchuan Li, Wenyi Bao, Feng Ji, Jingtao Dong, Jingjing Chen, Mengjie Xu, Rongsheng Lu

AIP Advances

DOI

2023

Picometer-scale optical vortex interferometer using azimuthal complex spectrum analysis

Jingtao Dong, Tengda Zhang, Yu‐Zhong Zhang, Lei Yang, Rongsheng Lu

Optics Letters

DOI

2023

Dynamic non-uniform phase shift measurement via Doppler frequency shift in vortex interferometer

Jingtao Dong, Zhipeng Tian, Shuo Wang, Liyuan Xie, Yangyang Li, Enxi Zhao

Optics Letters

DOI

2023

Enhancement of LIBS plasma and efficient collection of emitted light by open smooth triangular cavity

Lei Yang, Yan-Hui Zhang, Yin-Chuan Li, Lei Qin, Jingtao Dong, Feng Ji, Yong-Qing Wei, Song-Ching Chang, Rong-Sheng Lu

Journal of Analytical Atomic Spectrometry

DOI

2022

数字图像处理课程教学实践与思考

张育中，卢荣胜，董敬涛，杨蕾，郎贤礼

《大学教育》

2022

数字信号处理课程中频率分辨率的教学探讨

张腾达，董敬涛，杨蕾，卢荣胜，张育中

《高教学刊》

2022

Development of a confocal line-scan laser scattering probe for dark-field surface defects detection of transmissive optics

Jingtao Dong, Kai Chang, Zhipeng Tian, Tengda Zhang, Xianli Lang, Yuzhong Zhang, Rongsheng Lu, Xinglong Xie

Review of Scientific Instruments

DOI

2022

Robust dynamic phase-shifting common-path shearography using LCPG and pixelated micropolarizer array

Peizheng Yan, Xiangwei Liu, Jingtao Dong, Yonghong Wang, Biao Wang, Jianquan Li, Fangyuan Sun

Optics and Lasers in Engineering

DOI

2022

Effects of sample surface morphology on laser-induced breakdown spectroscopy

Lei Yang, Yanhui Zhang, Zi Meng Zhang, Yinchuan Li, Yong Xiang, Jingtao Dong, Yongqing Wei, Songtao Chang, Rongsheng Lu

Journal of Analytical Atomic Spectrometry

DOI

2021

Automatic defect inspection of thin film transistor-liquid crystal display panels using robust one-dimensional Fourier reconstruction with non-uniform illumination correction

Tengda Zhang, Jingtao Dong, Lei Yang, Shanlin Liu, Rongsheng Lu

Review of Scientific Instruments

DOI

2021

Sensitivity enhancement in photothermal interferometry by balanced detection of the complex response to moving excitation

Jingtao Dong, Xinglong Xie, Lei Yang, Xianli Lang, Rongsheng Lu, Tengda Zhang, Lei Zhang, Sheng Zhou, Jingsong Li

Optics Letters

DOI

2021

Noise characterization and compensation for a charge-coupled-device-based pyrometer

Yuzhong Zhang, Fucheng Lu, Wenjing Wang, Shuangbao Shu, Jingtao Dong, Xiaojie Tao

Review of Scientific Instruments

DOI

2020

Dual-wavelength Mach-Zehnder interferometry-assisted photothermal spectroscopy for characterization of surface contaminants

Jingtao Dong, Peizheng Yan, Lei Yang, Yuzhong Zhang, Tengda Zhang, Lei Zhang, Sheng Zhou, Jingsong Li

Optics Express

DOI

2020

Calibration and measurement performance analysis for a spectral band charge-coupled-device-based pyrometer

Yuzhong Zhang, Wuqiong Zhang, Zhe Dong, Shuangbao Shu, Jingtao Dong, Chenyao Xing

Review of Scientific Instruments

DOI

2020

Time-resolved laser scanning photothermal microscopy for characterization of thermal properties of semi-insulating GaAs

Jingtao Dong, Tengda Zhang, Lei Yang, Peizheng Yan, Yuzhong Zhang, Jingsong Li, Lei Zhang, Sheng Zhou

Optics Express

DOI

2020

Decoupling of thermo-electronic effect by traveling photothermal mirror method for characterization of thermal properties of semiconductors

Jingtao Dong, Jianquan Li, Lei Yang, Tengda Zhang, Rongsheng Lu, Jingsong Li, Lei Zhang, Sheng Zhou

Applied Physics Letters

DOI

2019

Dual-loop Sagnac interferometer with a geometric phase shifter for quadrature phase bias locking

Jingtao Dong, Rongsheng Lu

Optics Letters

DOI

2019

Heat coupling effect on photothermal detection with a moving Gaussian excitation beam

Jingtao Dong, Rongsheng Lu

Applied Optics

DOI

2019

Spatial modulation of heat source for highly sensitive photothermal detection

Jingtao Dong, Tengda Zhang, Yuzhong Zhang, Lei Yang, Rongsheng Lu

Applied Physics Letters

DOI

2019

Comparison of photothermal responses under spatial and temporal modulations of CW Gaussian beam excitation: A numerical study

Jingtao Dong, Rongsheng Lu, Zhouling Wu, Jian Chen

Journal of Applied Physics

DOI

2018

相移条纹投影三维形貌测量技术综述

毛翠丽，卢荣胜，董敬涛，张育中

《计量学报》

2018

Multi-channel averaging detection for fast imaging of weakly absorbing defects in surface thermal lensing

Jingtao Dong, Rongsheng Lu, Tengda Zhang, Lei Yang, Yuzhong Zhang, Zhouling Wu, Jian Chen

Review of Scientific Instruments

DOI

2018

Characterization of weakly absorbing thin films by multiple linear regression analysis of absolute unwrapped phase in angle-resolved spectral reflectometry

Jingtao Dong, Rongsheng Lu

Optics Express

DOI

2018

Retrieval of the thickness and refractive index dispersion of parallel plate from a single interferogram recorded in both spectral and angular domains

Jingtao Dong, Rongsheng Lu

Journal of Applied Physics

DOI

2017

Angle-resolved spectral Fabry–Pérot interferometer for single-shot measurement of refractive index dispersion over a broadband spectrum

Jingtao Dong, F Ji, H J Xia, Z J Liu, Tian Zhang, L Yang

Measurement Science and Technology

DOI

2017

Line-scanning laser scattering system for fast defect inspection of a large aperture surface

Jingtao Dong

Applied Optics

DOI

2017

Development of an infrared absorption measurement system for large aperture optics

Jian Chen, Jingtao Dong, Bing-Bing Li, Zhou-Ling Wu

DOI

2015

Photothermal microscopy: an effective diagnostic tool for laser irradiation effects on fused silica and KDP

Zhou-Ling Wu, Jian Chen, Jingtao Dong

Other Conferences

DOI

2015

Evaluation of surface and bulk qualities of semiconductor materials by a laser-induced photothermal technique

Jingtao Dong, Jian Chen, Shi-Wen Sun, Da-Wei Zhang, Song-Lin Zhuang, Zhou-Ling Wu

Other Conferences

DOI

2015

Photothermal studies of the radiation effects on weakly absorptive optical thin film coatings induced by high repetitive laser pulses

Jingtao Dong, Jian Chen, Zhou-Ling Wu, Hua-Song Liu, Yi-Qin Ji

Photonics West - Lasers and Applications in Science and Engineering

DOI

2015

In-situ investigation of damage processes on fused silica induced by a pulsed 355nm laser with high repetition rate

Jian Chen, Jingtao Dong, Zhou-Ling Wu

Photonics West - Lasers and Applications in Science and Engineering

DOI

2015

Optical fiber sensing-based laser excitation heat wave signal detection device

Bing-Bing Li, Jian Chen, Jingtao Dong, Zhou-Ling Wu

2015

Optical material defect real-time imaging apparatus based on photothermal detection and optical microscopy

Bing-Bing Li, Jingtao Dong, Jian Chen, Zhou-Ling Wu

2014

A sensitive optical probe for surface topography based on an optimized astigmatic method

Jingtao Dong, Gang Xiao, Jian Chen, Zhou-Ling Wu

Optics & Photonics - Optical Engineering + Applications

DOI

2014

Three-dimensional photothermal microscopy of KDP crystals

Jian Chen, Jingtao Dong, Qi Zhang, Zhou-Ling Wu

Optics & Photonics - Optical Engineering + Applications

DOI

2014

Development of an automated absorption measurement instrument (a “turn-key” system) for optical thin film coatings

Jingtao Dong, Jian Chen, Zhou-Ling Wu

Laser Damage

DOI

2014

Three dimensional mapping of absorption defects at 355 nm for potassium dihydrogen phosphate (KDP) used in high power laser systems

Jian Chen, Jingtao Dong, Qi Zhang, Zhou-Ling Wu

Laser Damage

DOI

2014

Photothermal microscopic studies of surface and subsurface defects on fused silica at 355nm

Jian Chen, Jingtao Dong, Qi Zhang, Zhou-Ling Wu

Laser Damage

DOI

2013

Polarization-sensitive white light interferometer with an autofocus device

Rongsheng Lu, Jingtao Dong, Lin Chen, Yan-qiong Shi, Rui-xue Xia

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI

2013

Study of photothermal response in thin film coatings by ellipsometry

Jingtao Dong, Jian Chen, Zhou-Ling Wu

Pacific Rim Laser Damage

DOI

2013

Development of a "turn-key" system for weak absorption measurement and analysis

Jian Chen, Jingtao Dong, Zhou-Ling Wu

Pacific Rim Laser Damage

DOI

2013

Multi-angle and multi-point measuring device and method of laser gain medium cladding residual reflection

Jingtao Dong, Jian Chen, Zhou-Ling Wu

2013

Auxiliary device for light beam accurate guiding and calibration

Jingtao Dong, Zhou-Ling Wu, Jian Chen, Feng Jiang

2012

基于频域分析的光学相干显微镜中的色散补偿

董敬涛，卢荣胜

《中国激光》

2012

Linnik偏振白光干涉微纳测量的关键技术研究

董敬涛

《合肥工业大学》

2012

Linnik白光干涉仪自动对焦及光程差最小化

李勇，吴奎，卢荣胜，董敬涛

《光电工程》

2012

Sensitivity analysis of thin-film thickness measurement by vertical scanning white-light interferometry

Jingtao Dong, Rongsheng Lu

Applied Optics

DOI

2012

Two-dimensional and three-dimensional integrated imaging measurement system

R. Lu, Yan-Qiong Shi, Rui-Xue Xia, Jingtao Dong, Lin Chen

2012

Dispersion Compensation Based on Frequency Domain Analysis in Optical Coherence Microscopy

Jingtao Dong, R. Lu

DOI

2011

A five-point stencil based algorithm used for phase shifting low-coherence interference microscopy

Jingtao Dong, Rongsheng Lu

Optics and Lasers in Engineering

DOI

2011

Automated determination of best focus and minimization of optical path difference in Linnik white light interferometry

Jingtao Dong, Rongsheng Lu, Yong Li, Kui Wu

Applied Optics

DOI

2011

CAIP system for vision-based on-machine measurement

Rui-xue Xia, Rongsheng Lu, Yan-qiong Shi, Qi Li, Jingtao Dong, Ning Liu

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI

2011

Optical design of color light-emitting diode ring light for machine vision inspection

Jingtao Dong, Rong-Sheng Lu, Yan-Qiong Shi, Rui-Xue Xia, Qi Li, Yan Xu

Optical Engineering

DOI

2011

Achromatic phase shifter with eight times magnification of rotation angle in low coherence interference microscopy

Jingtao Dong, Rongsheng Lu

Applied Optics

DOI

2011

Normal displacement and angle sensing optical measuring head and measuring method thereof

Ning Liu, R. Lu, Yan-Qiong Shi, Rui-Xue Xia, Qi Li, Jingtao Dong

2010

Non-contact three-dimensional optical measuring head and method for in-situ measurement of numerical control machine

R. Lu, Rui-Xue Xia, Nan-Nan Li, Jingtao Dong

精选作品

期刊论文

Dark-field differential confocal microscopy for three-dimensional detection of subsurface defects

High-resolution spiral phase contrast microscope: From Fourier filtering to match filtering

基于点到线共焦的暗场激光散射表面缺陷检测

基于多普勒效应的载波涡旋干涉动态位移测量

Steady-state thermal lens strength detection via thermally induced diffraction effect

Stabilizing Orthogonal Phase Bias of Mach–Zehnder Interferometer via Dual-Wavelength Feedback and Geometric Phase Shifter

Quantitative detection of weak scratches of optical elements based on image segmentation and connection of broken scratches

The detection of elemental content changes in electrode coating using laser-induced breakdown spectroscopy

Optical vortex interferometer: An overview of interferogram demodulation methods for dynamic phase measurement

Spectral correction study to reduce the influence of sample surface morphology on laser-induced breakdown spectroscopy

Dark-field line confocal imaging with point confocality and extended line field for bulk defects detection

Photothermal vortex interferometer with azimuthal complex spectra analysis for the measurement of laser-induced nanoscale thermal lens dynamics

Three-dimensional measurement of laser-induced thermal mirror dynamics using photothermal vortex interferometer with azimuthal phase spectra analysis

Dynamic surface displacement measurement using carrier optical vortex interferometer: A numerical study

Carrier optical vortex interferometer using segmentation demodulation method for dynamic measurement of axisymmetric surface deformation

Identification and classification of recyclable waste using laser-induced breakdown spectroscopy technology

Picometer-scale optical vortex interferometer using azimuthal complex spectrum analysis

Dynamic non-uniform phase shift measurement via Doppler frequency shift in vortex interferometer

Enhancement of LIBS plasma and efficient collection of emitted light by open smooth triangular cavity

数字图像处理课程教学实践与思考

数字信号处理课程中频率分辨率的教学探讨

Development of a confocal line-scan laser scattering probe for dark-field surface defects detection of transmissive optics

Robust dynamic phase-shifting common-path shearography using LCPG and pixelated micropolarizer array

Effects of sample surface morphology on laser-induced breakdown spectroscopy

Automatic defect inspection of thin film transistor-liquid crystal display panels using robust one-dimensional Fourier reconstruction with non-uniform illumination correction

Sensitivity enhancement in photothermal interferometry by balanced detection of the complex response to moving excitation

Noise characterization and compensation for a charge-coupled-device-based pyrometer

Dual-wavelength Mach-Zehnder interferometry-assisted photothermal spectroscopy for characterization of surface contaminants

Calibration and measurement performance analysis for a spectral band charge-coupled-device-based pyrometer

Time-resolved laser scanning photothermal microscopy for characterization of thermal properties of semi-insulating GaAs

Decoupling of thermo-electronic effect by traveling photothermal mirror method for characterization of thermal properties of semiconductors

Dual-loop Sagnac interferometer with a geometric phase shifter for quadrature phase bias locking

Heat coupling effect on photothermal detection with a moving Gaussian excitation beam

Spatial modulation of heat source for highly sensitive photothermal detection

Comparison of photothermal responses under spatial and temporal modulations of CW Gaussian beam excitation: A numerical study

相移条纹投影三维形貌测量技术综述

Multi-channel averaging detection for fast imaging of weakly absorbing defects in surface thermal lensing

Characterization of weakly absorbing thin films by multiple linear regression analysis of absolute unwrapped phase in angle-resolved spectral reflectometry

Retrieval of the thickness and refractive index dispersion of parallel plate from a single interferogram recorded in both spectral and angular domains

Angle-resolved spectral Fabry–Pérot interferometer for single-shot measurement of refractive index dispersion over a broadband spectrum

Line-scanning laser scattering system for fast defect inspection of a large aperture surface

Development of an infrared absorption measurement system for large aperture optics

Photothermal microscopy: an effective diagnostic tool for laser irradiation effects on fused silica and KDP

Evaluation of surface and bulk qualities of semiconductor materials by a laser-induced photothermal technique

Photothermal studies of the radiation effects on weakly absorptive optical thin film coatings induced by high repetitive laser pulses

In-situ investigation of damage processes on fused silica induced by a pulsed 355nm laser with high repetition rate

Optical fiber sensing-based laser excitation heat wave signal detection device

Optical material defect real-time imaging apparatus based on photothermal detection and optical microscopy

A sensitive optical probe for surface topography based on an optimized astigmatic method

Three-dimensional photothermal microscopy of KDP crystals

Development of an automated absorption measurement instrument (a “turn-key” system) for optical thin film coatings

Three dimensional mapping of absorption defects at 355 nm for potassium dihydrogen phosphate (KDP) used in high power laser systems

Photothermal microscopic studies of surface and subsurface defects on fused silica at 355nm

Polarization-sensitive white light interferometer with an autofocus device

Study of photothermal response in thin film coatings by ellipsometry

Development of a "turn-key" system for weak absorption measurement and analysis

Multi-angle and multi-point measuring device and method of laser gain medium cladding residual reflection

Auxiliary device for light beam accurate guiding and calibration

基于频域分析的光学相干显微镜中的色散补偿

Linnik偏振白光干涉微纳测量的关键技术研究

Linnik白光干涉仪自动对焦及光程差最小化

Sensitivity analysis of thin-film thickness measurement by vertical scanning white-light interferometry

Two-dimensional and three-dimensional integrated imaging measurement system

Dispersion Compensation Based on Frequency Domain Analysis in Optical Coherence Microscopy

A five-point stencil based algorithm used for phase shifting low-coherence interference microscopy

Automated determination of best focus and minimization of optical path difference in Linnik white light interferometry

CAIP system for vision-based on-machine measurement

Optical design of color light-emitting diode ring light for machine vision inspection

Achromatic phase shifter with eight times magnification of rotation angle in low coherence interference microscopy

Normal displacement and angle sensing optical measuring head and measuring method thereof

Non-contact three-dimensional optical measuring head and method for in-situ measurement of numerical control machine

会议论文

DVD测头S曲线的变化规律受被测表面特性的影响

研究方向