2024
Current-collapse suppression and leakage-current decrease in AlGaN/GaN HEMT by sputter-TaN gate-dielectric layer
Bo-Sen Liu, Guo-Hao Yu, H. Jia, Jingyuan Zhu, Ji-Aan Zhou, Yu Li, Bing-Liang Zhang, Zhongkai Du, Bo-Han Guo, Lu Wang, Qizhi Huang, Leifeng Jiang, Zhong-Ming Zeng, Zhipeng Wei, Bao-Shun Zhang
Journal of Semiconductors