百晓学者学者目录

梁华国

合肥工业大学计算机与信息学院

精选作品

期刊论文

  1. 胡晓晗，陈田，梁华国，刘军，鲁迎春（2026）. 基于非均匀旋转的半监督晶圆图缺陷模式识别方法. 《传感器与微系统》.
  2. 鲁迎春，赵宏岩，王健安，汪月，梁华国，黄正峰（2026）. 兼顾版图的低功耗四点翻转自恢复锁存器设计. 《微电子学》.DOI
  3. 吴文俊，梁华国，游畅，窦贤锐，肖家辉，鲁迎春（2026）. 一种基于扇出重汇聚的可测性评估方法. 《电子与信息学报》.
  4. 陈田，陈炜坤，刘军，梁华国，鲁迎春（2026）. 一种面向单片三维集成电路层间通孔的并行测试方法. 《电子与信息学报》.
  5. 鲍善鑫，梁华国，胡杰文，邵志伟，章宏，鲁迎春（2026）. 基于布局布线信息的单元间桥接缺陷测试方法. 《合肥工业大学学报(自然科学版)》.
  6. Yiming Ouyang, Jingyu Chen, Jianhua Li, Huaguo Liang (2026). An Efficient Virtual Channel Power-Gating Method using Dynamic Bypass in NoC Routers. ACM Journal on Emerging Technologies in Computing Systems.DOI
  7. Liang Yao, Deqin Shi, Lanfang Liu, Ying Zhang, Yunlai Zhu, Zhengfeng Huang, Huaguo Liang, Yingchun Lu, Aibin Yan, Yaohua Xu (2026). Highly Robust Obfuscated Arbiter PUF Based on the Lorenz Attractor System. IEEE Transactions on Very Large Scale Integration (VLSI) Systems.DOI
  8. Zikang Ma, Zhongyu Gao, Xing Lin Guo, Qianhui Liu, Yi Man, Huaguo Liang, Xiaoqing Wen (2026). LTTL: A Low-Overhead and Triple-Node-Upset-Tolerant Latch Design for Aerospace Applications. ACM Great Lakes Symposium on VLSI (GLSVLSI).DOI
  9. Yuhao Wang, Liang Yao, Shuai Xiang, Lili Xu, H B Wu, Jiachen Gao, Ziqing Chen, Tao Chen, Huaguo Liang, Yaohua Xu (2026). A CLS-Based Driven Classified Truncation Approximate Booth Multiplier for High-Fidelity Image Processing. IEEE Transactions on Very Large Scale Integration (VLSI) Systems.DOI
  10. Liang Yao, Peiyang Kang, Yaohua Xu, Yun Qing Yang, Huaguo Liang, Zhengfeng Huang, Yingchun Lu (2026). Multi-channel TRNG based on Scalable Cascaded Full Feedback Ring Oscillator. ACM Transactions on Design Automation of Electronic Systems.DOI
  11. Tian Chen, Ziyuan Fan, Beibei Luo, Jun Liu, Xiaohui Yuan, Huaguo Liang, Yingchun Lu (2026). Reconfigurable LFSR Self-Testing for Three-Dimensional Stacked Integrated Circuit. IEEE Transactions on Components Packaging and Manufacturing Technology.DOI
  12. Yankun Lin, 高柏倫, Jingchang Bian, Huaguo Liang, Zhengfeng Huang, Xiaoqing Wen (2026). A Challenge-Response Remapping Reliability Enhancement Method for APUF Based on Adjacent Challenge-Bit Flipping. IEEE Internet of Things Journal.DOI
  13. 徐辉，唐琳，马瑞君，梁华国，黄正峰（2025）. 一种新型低开销抗三节点翻转的锁存器设计. 《计算机工程与科学》.
  14. 孙侠，袁野，徐辉，梁华国，黄正峰，肖鑫忠，黄文馨（2025）. 基于改进U-Net的光刻热点检测方法. 《激光与光电子学进展》.
  15. 李九七，徐辉，马瑞君，黄正峰，梁华国（2025）. 低开销的三节点翻转容忍锁存器设计. 《微电子学》.DOI
  16. 易茂祥，张佳桐，鲁迎春，梁华国，马利祥（2025）. 一种基于BRAM分段同步查表的测试向量编解码方案. 《电子与信息学报》.
  17. 刘军，陈志，陈田，程松仁，梁华国（2025）. 基于可重构环形振荡器的绑定后TSV故障测试. 《微电子学与计算机》.DOI
  18. 王斯禹，梁华国，黄杰，柏仕超，鲁迎春（2025）. 基于动态选通与抗亚稳态TDC的芯片延迟参数测量. 《电子测量与仪器学报》.DOI
  19. 窦贤锐，梁华国，黄正峰，鲁迎春，陈田，刘军（2025）. MOS管选通的硅通孔键合前测试. 《电子与信息学报》.
  20. 胡杰文，梁华国，鲍善鑫，章宏，邵志伟，鲁迎春（2025）. 一种不平衡电路的单元内开路检测方法. 《微电子学》.DOI
  21. Aibin Yan, Zhiyuan Pei, Xing Lin Guo, Jie Song, Cuiyun Jiang, Huaguo Liang, Xiaoqing Wen, Patrick Girard (2025). TNURML: Triple-Node-Upset-Recovery Magnetic Latch Design with Non-Volatility for Aerospace Applications. IEEE International Symposium on Circuits and Systems proceedings.DOI
  22. Yingchun Lu, Rong Hu, Xinkai Wu, Huaguo Liang, Zhengfeng Huang, Liang Yao, Lixiang Ma (2025). A Lightweight and High‐Throughput True Random Number Generator Based on Hybrid Entropy Source. International Journal of Circuit Theory and Applications.DOI
  23. 徐辉，朱烁，孙皓洁，马瑞君，梁华国，黄正峰（2024）. 一种基于C单元的三节点翻转自恢复锁存器. 《计算机工程与科学》.
  24. 徐冬雨，欧阳一鸣，黄正峰，李建华，梁华国（2024）. 一种基于自适应容错链路的片上网络设计与研究. 《电子与信息学报》.
  25. 孙成龙，欧阳一鸣，梁华国（2024）. 基于端口间缓冲区共享的流量感知可重构片上网络（英文）. ENGINEERING Information Technology & Electronic Engineering.
  26. 夏进，刘士兴，李航，李帮金，梁华国（2024）. 一种用于IC测试的精密测量单元电路设计. 《电子测量技术》.
  27. 欧阳一鸣，陈志远，徐冬雨，梁华国（2024）. 一种旁路机制下的低功耗片上网络功率门控设计. 《电子与信息学报》.
  28. Hong Zhang, Huaguo Liang, Yue Wang, Danqing Li, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zheng-Feng Huang (2024). Multi-transition delay test for improving the coverage of cell internal defects. IEICE Electronics Express.DOI
  29. Jinhao Xie, Huaguo Liang, Changlong Cao, Liang Yao, Yingchun Lu (2024). A machine learning resistant PUF circuit adjustment method based on strict avalanche criterion. IEICE Electronics Express.DOI
  30. Yi-Ming Ouyang, Cheng Cao, Dongyu Xu, Wu Zhou, Zheng-Feng Huang, Huaguo Liang (2024). DBU-PG: energy-efficient noc design using dual-buffering power gating. Journal of Supercomputing.DOI
  31. Zhengfeng Huang, Zishuai Li, Liting Sun, Huaguo Liang, Tian-Ming Ni, Ai-Bin Yan (2024). A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements. Journal of electronic testing.DOI
  32. Jing-Chang Bian, Zhengfeng Huang, Yan-Kun Lin, Zhao Yang, Huaguo Liang, Tian-Ming Ni (2024). Reliability analysis and comparison of ring-PUF based on probabilistic models. Microelectronics Journal.DOI
  33. Yu Chen, Huaguo Liang, Ling Zhang, Liang Yao, Yingchun Lu (2024). High throughput dynamic dual entropy source true random number generator based on FPGA. Microelectronics Journal.DOI
  34. Yue Wang, Huaguo Liang, Hong Zhang, Danqing Li, Yingchun Lu, Maoxiang Yi, Zheng-Feng Huang (2024). A new characterization model of FinFET self-heating effect based on FinFET characteristic parameter. Microelectronic Engineering.DOI
  35. Zhengfeng Huang, Jing-Chang Bian, Yan-Kun Lin, Huaguo Liang, Tian-Ming Ni (2024). Design Guidelines and Feedback Structure of Ring Oscillator PUF for Performance Improvement. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.DOI
  36. Yiming Ouyang, Shuaijie Yuan, Jianhua Li, Huaguo Liang (2024). F-Bypass: A Low-Power Network-on-Chip Design Utilizing Bypass to Improve Network Connectivity. ACM Journal on Emerging Technologies in Computing Systems.DOI
  37. Yiming Ouyang, Zhi-Yuan Chen, Dongyu Xu, Huaguo Liang (2024). SPONGE+: A NoC-based power gating scheme for overall router column opening and closing control. Microelectronics Journal.DOI
  38. Chenglong Sun, Yiming Ouyang, Huaguo Liang (2024). Traffic-oriented reconfigurable NoC with augmented inter-port buffer sharing. Frontiers of Information Technology & Electronic Engineering.DOI
  39. 肖远，梁华国，汪玉传，鲁迎春，易茂祥，姚亮（2023）. 非线性优化的时间数字转换器设计. 《微电子学》.
  40. 王燕捷，梁华国，孙克仲，姚亮，蒋翠云，易茂祥，鲁迎春（2023）. 一种基于熵源分离模型的可重构安全原语. 《微电子学》.
  41. 姚亮，梁华国，杨世豪，章宏，鲁迎春（2023）. 利用多路选择器熵源的高移植性轻量级物理不可克隆函数研究. 《电子与信息学报》.
  42. 姚亮，黄正峰，梁华国，鲁迎春（2023）. 利用细粒度采样的低开销双输出异或门真随机数发生器研究. 《电子与信息学报》.
  43. 刘正文，易茂祥，杨云，孙立法，鲁迎春，梁华国（2023）. 一种高吞吐率自治布尔网络真随机数发生器. 《电子测量与仪器学报》.
  44. 刘士兴，李江晖，夏进，易茂祥，梁华国（2023）. 应用于ATE的时间测量单元设计. 《电子测量与仪器学报》.
  45. 汪玉传，梁华国，鲁迎春，肖远（2023）. 基于STR的两级差分的高精度低功耗TDC. 《电子测量与仪器学报》.
  46. 汤宇新，梁华国，潘宇琦，易茂祥，鲁迎春（2023）. 基于邻域信息的细粒度在线适应性测试. 《电子测量技术》.
  47. 欧阳一鸣，陈荣景，王奇，梁华国（2023）. 基于故障感知容错路由算法的可重构架构设计. 《电子测量与仪器学报》.
  48. 梁华国，曲金星，潘宇琦，汤宇新，易茂祥，鲁迎春（2023）. 低测试逃逸的晶圆级适应性测试方法. 《电子与信息学报》.
  49. Zhengfeng Huang, Dongxing Ma, Runwu Ji, Huaguo Liang, Ai-Bin Yan, Tai Song, Tian-Ming Ni (2023). Overhead Optimized and Quadruple-Node-Upset Self-Recoverable Latch Design Based on Looped C-Element Matrix. IEEE Transactions on Aerospace and Electronic Systems.DOI
  50. Qi Wang, Yi-Ming Ouyang, Zhengfeng Huang, Huaguo Liang (2023). Workload-Aware WiNoC Design with Intelligent Reconfigurable Wireless Interface. Security and Communication Networks.DOI
  51. Yong-Xia Sheng, Huaguo Liang, Bao Fang, Cui-Yun Jiang, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu (2023). Design of approximate Booth multipliers based on error compensation. Integr..DOI
  52. Dongyu Xu, Yi-Ming Ouyang, Wu Zhou, Huaguo Liang (2023). Improving power and performance of on-chip network through virtual channel sharing and power gating. Integr..DOI
  53. Liang Yao, Huaguo Liang, Yingchun Lu (2023). Low-overhead TRNG based on MUX for cryptographic protection using multiphase sampling. Journal of Supercomputing.DOI
  54. Hui Xu, Jing Zhou, Ruijun Ma, Huaguo Liang, Zhengfeng Huang, Chaoming Liu (2023). LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy. Integr..DOI
  55. Yi-Ming Ouyang, Jiaxin Wang, Cheng-Long Sun, Qi Wang, Huaguo Liang (2023). URMP: using reconfigurable multicast path for NoC-based deep neural network accelerators. Journal of Supercomputing.DOI
  56. Wu Zhou, Yi-Ming Ouyang, Dongyu Xu, Zhengfeng Huang, Huaguo Liang, Xiao-Qing Wen (2023). Energy-Efficient Multiple Network-on-Chip Architecture With Bandwidth Expansion. IEEE Transactions on Very Large Scale Integration (vlsi) Systems.DOI
  57. Jing-Chang Bian, Zhengfeng Huang, Peng Ye, Zhao Yang, Huaguo Liang (2023). A Reliability-Aware Splitting Duty-Cycle Physical Unclonable Function Based on Trade-off Process, Voltage, and Temperature Variations. ACM Trans. Design Autom. Electr. Syst..DOI
  58. Zhengfeng Huang, Yan Zhang, Wenhui Wu, Lanxi Duan, Huaguo Liang, Yi-Ming Ouyang, Ai-Bin Yan, Tai Song (2023). A high-speed quadruple-node-upset-tolerant latch in 22 nm CMOS technology. Microelectronics and reliability.DOI
  59. Hui Xu, Chaoming Liu, Ruijun Ma, Huaguo Liang, Zhengfeng Huang, Jing Zhou, Shuo Zhu (2023). A triple-node-upset self-recoverable design based on Schmitt-triggers and C-elements. Microelectronics and reliability.DOI
  60. Dongyu Xu, Yi-Ming Ouyang, Wu Zhou, Zhengfeng Huang, Huaguo Liang, Xiao-Qing Wen (2023). RMC_NoC: A Reliable On-Chip Network Architecture With Reconfigurable Multifunctional Channel. IEEE Transactions on Very Large Scale Integration (vlsi) Systems.DOI
  61. Liyu Jin, Maoxiang Yi, Yuan Xiao, Li-Fa Sun, Yingchun Lu, Huaguo Liang (2023). A dynamically reconfigurable entropy source circuit for high-throughput true random number generator. Microelectronics Journal.DOI
  62. Yuan Xiao, Huaguo Liang, Li-Wen Jin, Yu-Chuan Wang, Zhiwei Shao, Yue Wang, Yingchun Lu (2023). Design of a high-accuracy time-to-digital converter based on dual-edge signals. Journal of Instrumentation.DOI
  63. Danqing Li, Huaguo Liang, Hong Zhang, Yue Wang, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang (2023). BPath-RO: A Performance- and Area-Efficient In Situ Delay Measurement Scheme for Digital IC. Electronics.DOI
  64. Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yi-Ming Ouyang, Ai-Bin Yan (2023). Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. Journal of electronic testing.DOI
  65. Hong Zhang, Huaguo Liang, Jiewen Hu, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang (2023). Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern. Microelectronics Journal.DOI
  66. Zhengfeng Huang, Yan Zhang, Lei Ai, Huaguo Liang, Tian-Ming Ni, Tai Song, Ai-Bin Yan (2023). Designs of High-Speed Triple-Node-Upset Hardened Latch Based on Dual-Modular-Redundancy. J. Circuits Syst. Comput..DOI
  67. Yingchun Lu, Yun-Fan Yang, Rong Hu, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang, Yuan-Ming Ma, Tian Chen, Liang Yao (2023). High-efficiency TRNG Design Based on Multi-bit Dual-ring Oscillator. ACM Transactions on Reconfigurable Technology and Systems.DOI
  68. Yi-Ming Ouyang, Dongyu Xu, C. Qian, Wu Zhou, Qi Wang, Huaguo Liang (2023). Dynamic detection of wireless interface faults and fault-tolerant routing algorithm in WiNoC. Integr..DOI
  69. 盛勇侠，梁华国，肖远，蒋翠云，易茂祥，鲁迎春（2022）. 基于新型压缩树的近似Booth乘法器. 《微电子学》.
  70. 徐皓，易茂祥，金礼玉，梁华国，鲁迎春（2022）. 电路分区自比较的硬件木马检测方法. 《合肥工业大学学报(自然科学版)》.
  71. 胡兴盛，徐皓，易茂祥，梁华国，鲁迎春（2022）. 融入环形振荡器木马特征的无监督硬件木马检测. 《微电子学》.
  72. 马俊祥，梁华国，李丹青，易茂祥，鲁迎春，蒋翠云（2022）. 一种低开销的旁路重构RO的片上老化测量方案. 《微电子学》.
  73. Zhengfeng Huang, Zhou Gong, Dongxing Ma, Xiao-Lei Wang, Yingchun Lu, Wen-Fa Zhan, Huaguo Liang, Tian-Ming Ni (2022). Fault-avoidance C-element based low overhead and TNU-resilient latch. Microelectronics Journal.DOI
  74. Zhengfeng Huang, Wanshu Zhong, Lanxi Duan, Yue Zhang, Huaguo Liang, Jia-Nan Wang, Tai Song, Yingchun Lu (2022). Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements. J. Circuits Syst. Comput..DOI
  75. Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang (2022). A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design. Journal of electronic testing.DOI
  76. Hui Xu, Rui Zhu, Xia Sun, Xianjin Fang, Pan Qi, Huaguo Liang, Zhengfeng Huang (2022). Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction. J. Circuits Syst. Comput..DOI
  77. Yi-Ming Ouyang, Ruifeng Li, Chun-Lei Hu, Qi Wang, Yingchun Lu, Huaguo Liang (2022). Design of fully adaptive routing and hybrid VC allocation in wireless NOC. Microelectronics Journal.DOI
  78. Yi-Ming Ouyang, Dongyu Xu, Zhi-Mou Chen, Rong-bang Chen, Wu Zhou, Huaguo Liang (2022). REE: Reconfigurable and energy-efficient router architecture in wireless network-on-chip. Microelectronics Journal.DOI
  79. Yanjie Wang, Huaguo Liang, Yu-Chuan Wang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu (2022). A reconfigurable PUF structure with dual working modes based on entropy separation model. Microelectronics Journal.DOI
  80. Chen Tian, Jian-Yong Lu, Liu Jun, Huaguo Liang, Yingchun Lu, Maoxiang Yi (2022). A reconfigurable test method based on LFSR for 3D stacking integrated circuits. Integr..DOI
  81. Wu Zhou, Yi-Ming Ouyang, Yingchun Lu, Huaguo Liang (2022). A router architecture with dual input and dual output channels for Networks-on-Chip. Microprocessors and microsystems.DOI
  82. J. Cui, Maoxiang Yi, Di Cao, Liang Yao, Xinyu Wang, Huaguo Liang, Zhengfeng Huang, Haochen Qi, Tian-Ming Ni, Yingchun Lu (2022). Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator. IEEE Transactions on Circuits and Systems - II - Express Briefs.DOI
  83. Liang Yao, Huaguo Liang, Hong Zhang, Tian-Ming Ni, Maoxiang Yi, Yingchun Lu (2022). A Lightweight M_TRNG Design based on MUX Cell Entropy using Multiphase Sampling. Asian Hardware-Oriented Security and Trust Symposium.DOI
  84. 欧阳一鸣，张鹏，王奇，安鑫，梁华国（2021）. WiNoC中交叉开关仲裁及路由算法设计. 《电子学报》.
  85. 左小寒，梁华国，倪天明，杨兆，束月，蒋翠云，鲁迎春（2021）. 基于间隔分组的TSV聚簇故障冗余结构. 《电子学报》.
  86. 黄正峰，潘尚杰，曹剑飞，宋钛，欧阳一鸣，梁华国，倪天明，鲁迎春（2021）. 32nm CMOS工艺三点翻转自恢复锁存器设计. 《电子学报》.
  87. 徐辉，孙聪，周乐，梁华国，黄正峰，李丹青（2021）. 基于双模互锁的抗三节点翻转锁存器设计. 《半导体技术》.DOI
  88. 黄正峰，曹迪，崔建国，鲁迎春，欧阳一鸣，戚昊琛，徐奇，梁华国，倪天明（2021）. 32 nm CMOS工艺的单粒子多点翻转加固锁存器设计. 《计算机辅助设计与图形学学报》.
  89. 欧阳一鸣，陈志谋，王奇，鲁迎春，黄正峰，梁华国（2021）. WiNoC中基于Edge-first算法的流量平衡设计. 《电子测量与仪器学报》.DOI
  90. 方宝，梁华国，盛勇侠，蒋翠云，易茂祥，黄正峰，鲁迎春，徐辉（2021）. 一种基于近似压缩器的低功耗近似乘法器. 《微电子学》.DOI
  91. 鲁迎春，梁华国，王鑫宇，姚亮，倪天明，易茂祥，戚昊琛，黄正峰（2021）. 一种基于环形振荡器的轻量级高效率的真随机数发生器. 《电子测量与仪器学报》.DOI
  92. 侯旺超，梁华国，宋钛，万金磊，蒋翠云（2021）. 联合mRMR算法和BP神经网络的集成电路测试方法. 《微电子学》.DOI
  93. Liang Yao, Huaguo Liang, Zhengfeng Huang, Cui-Yun Jiang, Maoxiang Yi, Yingchun Lu (2021). A Lightweight Configurable XOR RO-PUF Design Based on Xilinx FPGA. International Conference on Emerging Technologies.DOI
  94. Hui Xu, Zehua Peng, Huaguo Liang, Zhengfeng Huang, Cong Sun, Le Zhou (2021). HTNURL: Design of a High-Performance Low-Cost Triple-Node Upset Self-Recoverable Latch. Electronics.DOI
  95. Zhengfeng Huang, Hao Wang, Ang Yang, Huaguo Liang, Yi-Ming Ouyang, Tian-Ming Ni (2021). A high-speed and triple-node-upset recovery latch with heterogeneous interconnection. Microelectronics Journal.DOI
  96. Huaguo Liang, Danqing Li, Zhao Yang, Tian-Ming Ni, Zhengfeng Huang, Cui-Yun Jiang (2021). A N:1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs. International Test Conference in Asia.DOI
  97. Qi Wang, Yi-Ming Ouyang, Yingchun Lu, Huaguo Liang, Dakai Zhu (2021). Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems. Journal of electronic testing.DOI
  98. Tian-Ming Ni, Qi Xu, Zhengfeng Huang, Huaguo Liang, Ai-Bin Yan, Xiao-Qing Wen (2021). A Cost-Effective TSV Repair Architecture for Clustered Faults in 3-D IC. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.DOI
  99. Yi-Ming Ouyang, Cheng-Fu Sun, Boyuan Jia, Qi Wang, Huaguo Liang (2021). Architecting a priority-based dynamic media access control mechanism in Wireless Network-on-Chip. Microelectronics Journal.DOI
  100. Zhengfeng Huang, Xiandong Li, Zhou Gong, Huaguo Liang, Yingchun Lu, Yi-Ming Ouyang, Tian-Ming Ni (2021). Design of MNU-Resilient latches based on input-split C-elements. Microelectronics Journal.DOI
  101. Hui Xu, Le Zhou, Huaguo Liang, Zhengfeng Huang, Cong Sun, Yafei Ning (2021). High-Performance Double-Node-Upset-Tolerant and Triple-Node-Upset-Tolerant Latch Designs. Electronics.DOI
  102. Tai Song, Huaguo Liang, Zhengfeng Huang, Tian-Ming Ni, Ying Sun (2021). Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs. IEICE Electronics Express.DOI
  103. Yi-Ming Ouyang, Qi Wang, Zhe Li, Huaguo Liang, Jian-Hua Li (2021). Fault-tolerant design for data efficient retransmission in WiNoC.DOI
  104. Xinyu Wang, Huaguo Liang, Yanjie Wang, Liang Yao, Yang Guo, Maoxiang Yi, Zhengfeng Huang, Haochen Qi, Yingchun Lu (2021). High-Throughput Portable True Random Number Generator Based on Jitter-Latch Structure. IEEE Transactions on Circuits and Systems Part 1: Regular Papers.DOI
  105. Yuan Zhang, Huaguo Liang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu (2021). A high reliability physically unclonable function based on multiple tunable ring oscillator. Microelectronics Journal.DOI
  106. Liang Yao, Huaguo Liang, Qian Han, Hong Zhang, Zhengfeng Huang, Cui-Yun Jiang, Maoxiang Yi, Yingchun Lu (2021). M-RO PUF: A portable pure digital RO PUF based on MUX unit. Microelectronics Journal.DOI
  107. Dawen Xu, Ziyang Zhu, Cheng Liu, Ying Wang, Shuang-xi Zhao, Lei Zhang, Huaguo Liang, Huawei Li, Kwang-Ting Cheng (2021). Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System. IEEE Transactions on Very Large Scale Integration (vlsi) Systems.DOI
  108. Hui Xu, Xuan Liu, Guo Yu, Huaguo Liang, Zhengfeng Huang (2021). LIHL: Design of a Novel Loop Interlocked Hardened Latch. Electronics.DOI
  109. Zhengfeng Huang, S. Pan, Hao Wang, Huaguo Liang, Tian-Ming Ni (2021). LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS. Microelectronics Journal.DOI
  110. Zhengfeng Huang, Di Cao, Jianguo Cui, Yingchun Lu, Huaguo Liang, Yi-Ming Ouyang, Tian-Ming Ni, Zhenmin Li (2021). Design of node separated triple-node-upset self-recoverable latch. Microelectronics Journal.DOI
  111. Yingchun Lu, Xinyu Wang, Yanjie Wang, Yuan Zhang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Huaguo Liang (2021). Pure Digital Scalable Mixed Entropy Separation Structure for Physical Unclonable Function and True Random Number Generator. IEEE Transactions on Very Large Scale Integration (vlsi) Systems.DOI
  112. Cheng-Long Sun, Yi-Ming Ouyang, Huaguo Liang (2021). Architecting a congestion pre-avoidance and load-balanced wireless network-on-chip. J. Parallel Distributed Comput..DOI
  113. Hui Xu, Cong Sun, Le Zhou, Huaguo Liang, Zhengfeng Huang (2021). Design of a Highly Robust Triple-Node-Upset Self-Recoverable Latch. IEEE Access.DOI
  114. Bao Fang, Huaguo Liang, Dawen Xu, Maoxiang Yi, Yong-Xia Sheng, Cui-Yun Jiang, Zhengfeng Huang, Yingchun Lu (2021). Approximate multipliers based on a novel unbiased approximate 4-2 compressor. Integr..DOI
  115. Huaguo Liang, Jinlei Wan, Tai Song, Wangchao Hou (2021). Identifying the Optimal Subsets of Test Items through Adaptive Test for Cost Reduction of ICs. Electronics.DOI
  116. Zhengfeng Huang, Di Cao, Jianguo Cui, Yingchun Lu, Yiming Ouyang, Haochen Qi, Qi Xu, Huaguo Liang, Tianming Ni (2021). Design of Multiple Node Upset Tolerant Latch in 32 nm CMOS Technology. Journal of Computer-Aided Design & Computer Graphics.DOI
  117. 欧阳一鸣，贾博远，李建华，黄正峰，梁华国（2020）. WiNoC中无线通信拥塞与故障感知的容错路由算法. 《电子学报》.
  118. 黄正峰，郭阳，潘尚杰，鲁迎春，梁华国，戚昊琛，欧阳一鸣，倪天明，徐奇（2020）. 32nm CMOS工艺单粒子三点翻转自恢复锁存器设计. 《计算机辅助设计与图形学学报》.
  119. 杨兆，梁华国，束月，左小寒，倪天明，黄正峰（2020）. 3D-IC中基于时分复用的TSV蜂窝容错设计. 《微电子学》.DOI
  120. 束月，梁华国，左小寒，杨兆，蒋翠云，倪天明（2020）. 对角线六边形的TSV冗余结构设计. 《微电子学》.DOI
  121. 应健锋，梁华国，江悦，蒋翠云，李丹青，黄正峰（2020）. 基于随机森林的X值输入灵敏度预测方法. 《计算机辅助设计与图形学学报》.
  122. 应健锋，梁华国，江悦，蒋翠云，李丹青，黄正峰（2020）. 一种多X值输入下测试覆盖率损失的预测方法. 《微电子学与计算机》.DOI
  123. 左小寒，梁华国，杨兆，束月，蒋翠云（2020）. 基于菱形分组器的TSV聚簇故障容错结构. 《微电子学与计算机》.DOI
  124. 江悦，梁华国，应健锋，周凯，马高亮，蒋翠云，鲁迎春，黄正峰（2020）. 一种适用于PUF可靠性提升的微弱延时测试方案. 《微电子学》.DOI
  125. Yi-Ming Ouyang, Qi Wang, Meng-Ge Ru, Huaguo Liang, Jian-Hua Li (2020). A Novel Low-Latency Regional Fault-Aware Fault-Tolerant Routing Algorithm for Wireless NoC. IEEE Access.DOI
  126. Ai-Bin Yan, Zhelong Xu, Jie Cui, Zuobin Ying, Zhengfeng Huang, Huaguo Liang, P. Girard, Xiao-Qing Wen (2020). Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications. International Symposium on Circuits and Systems.DOI
  127. Dawen Xu, Cheng Chu, Cheng Liu, Ying Wang, Xian-Zhong Zhou, Lei Zhang, Huaguo Liang, Huawei Li (2020). Multi-task Scheduling for PIM-based Heterogeneous Computing System. ACM Great Lakes Symposium on VLSI.DOI
  128. Tai Song, Huaguo Liang, Tian-Ming Ni, Zhengfeng Huang, Yingchun Lu, Ji Wan, Ai-Bin Yan (2020). Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm. IEEE Access.DOI
  129. Dawen Xu, Cheng Chu, Qianlong Wang, Cheng Liu, Ying Wang, L. Zhang, Huaguo Liang, Kwang-Ting Cheng (2020). A Hybrid Computing Architecture for Fault-tolerant Deep Learning Accelerators. ICCD.DOI
  130. Yingchun Lu, Huaguo Liang, Liang Yao, Xinyu Wang, Haochen Qi, Maoxiang Yi, Cui-Yun Jiang, Zhengfeng Huang (2020). Jitter-Quantizing-Based TRNG Robust Against PVT Variations. IEEE Access.DOI
  131. Dedong Zhao, Yi-Ming Ouyang, Qi Wang, Huaguo Liang (2020). cm3WiNoCs: Congestion-Aware Millimeter-Wave Multichannel Wireless Networks-on-Chip. IEEE Access.DOI
  132. Tian-Ming Ni, Hao Chang, Tai Song, Qi Xu, Zhengfeng Huang, Huaguo Liang, Ai-Bin Yan, Xiao-Qing Wen (2020). Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC. IEEE Transactions on Circuits and Systems - II - Express Briefs.DOI
  133. Tian-Ming Ni, Yao Yao, Hao Chang, Lin Lu, Huaguo Liang, Ai-Bin Yan, Zhengfeng Huang, Xiao-Qing Wen (2020). LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.DOI
  134. 倪天明，常郝，卞景昌，易茂祥，梁华国，黄正峰（2019）. 基于边沿延时翻转的绑定前硅通孔测试方法. 《电子学报》.
  135. 欧阳一鸣，汝孟轩，李建华，梁华国（2019）. WiNoC中协同拥塞控制的高性能路由器设计. 《电子测量与仪器学报》.DOI
  136. 欧阳一鸣，王薇，王奇，梁华国（2019）. WiNoC中拥塞避免的低功耗路由器设计. 《电子测量与仪器学报》.
  137. 黄正峰，李雪健，鲁迎春，欧阳一鸣，方祥圣，易茂祥，梁华国，倪天明（2019）. 65 nm CMOS工艺的低功耗加固12T存储单元设计. 《计算机辅助设计与图形学学报》.
  138. Tian-Ming Ni, Hao Chang, Shidong Zhu, Lin Lu, Xueyun Li, Qi Xu, Huaguo Liang, Zhengfeng Huang (2019). Temperature-Aware Floorplanning for Fixed-Outline 3D ICs. IEEE Access.DOI
  139. Tai Song, Huaguo Liang, Ying Sun, Zhengfeng Huang, Maoxiang Yi, Xiang-Sheng Fang, Ai-Bin Yan (2019). Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory. IEEE VLSI Test Symposium.DOI
  140. Kai Zhou, Huaguo Liang, Yue Jiang, Zhengfeng Huang, Cui-Yun Jiang, Ying-Chun Lu (2019). FPGA‐based RO PUF with low overhead and high stability. Electronics Letters.DOI
  141. Zhiyuan Song, Ai-Bin Yan, Jie Cui, Zhili Chen, Xue-Jun Li, Xiao-Qing Wen, Chaoping Lai, Zhengfeng Huang, Huaguo Liang (2019). A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells. International Test Conference in Asia.DOI
  142. Maoxiang Yi, Jing-Chang Bian, Tian-Ming Ni, Cui-Yun Jiang, Hao Chang, Huaguo Liang (2019). A Pulse Shrinking-Based Test Solution for Prebond Through Silicon via in 3-D ICs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.DOI
  143. Yi-Ming Ouyang, Qi Wang, Li-Zhu Hu, Huaguo Liang (2019). DVFS Based Error Avoidance Strategy in Wireless Network-on-Chip. Journal of electronic testing.DOI
  144. Yi-Ming Ouyang, Wu Zhou, Sheng Li, Zhi-Lu Wang, Huaguo Liang, Gao-Ming Du (2019). Design of a Wireless Router with Virtual Channel Fault Tolerant in WiNoC. J. Circuits Syst. Comput..DOI
  145. Tai Song, Huaguo Liang, Zhengfeng Huang, Jie Hou (2019). Reliability assurance in early-life-failure test through improved nearest neighbor regression.DOI
  146. Yi-Ming Ouyang, Zhe Li, Jian-Hua Li, Cheng-Long Sun, Huaguo Liang, Gao-Ming Du (2019). CPCA: An efficient wireless routing algorithm in WiNoC for cross path congestion awareness. Integr..DOI
  147. Yi-Ming Ouyang, Yang Zhao, Kun Xing, Zhengfeng Huang, Huaguo Liang, Jian-Hua Li (2019). Design of Wireless Network on Chip with Priority-Based MAC. J. Circuits Syst. Comput..DOI
  148. 欧阳一鸣，李胜，黄正峰，梁华国，安鑫（2018）. WiNoC中无线节点和无线链路级拥塞避免的高效路由器设计. 《电子学报》.
  149. 欧阳一鸣，胡立柱，安鑫，李建华，梁华国（2018）. 无线片上网络高性能EMS容错方案设计. 《仪器仪表学报》.DOI
  150. 欧阳一鸣，钱昌，杜高明，黄正峰，李建华，梁华国（2018）. WiNoC中EF-ACK容错无线接口设计. 《电子学报》.
  151. Kai Zhou, Huaguo Liang, Yue Jiang, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Yao Yao (2018). A High Reliability FPGA Chip Identification Generator Based on PDLs. Asian Test Symposium.DOI
  152. Yi-Ming Ouyang, Jian-Feng Yang, Kun Xing, Zhengfeng Huang, Huaguo Liang (2018). An improved communication scheme for non-HOL-blocking wireless NoC. Integr..DOI
  153. Yi-Ming Ouyang, Zhe Li, Kun Xing, Zhengfeng Huang, Huaguo Liang, Jian-Hua Li (2018). Design of Low-Power WiNoC with Congestion-Aware Wireless Node. J. Circuits Syst. Comput..DOI
  154. Tian Chen, Chenxin Lin, Huaguo Liang, Fuji Ren (2018). A Dictionary-Based Test Data Compression Method Using Tri-State Coding. Asian Test Symposium.DOI
  155. Zhengfeng Huang, Yang-Yang Zhang, Zian Su, Huaguo Liang, Huijie Yao, Tian-Ming Ni (2018). A Hybrid DMR Latch to Tolerate MNU Using TDICE and WDICE. Asian Test Symposium.DOI
  156. Xiumin Xu, Huaguo Liang, Kai Zhou, Gaoliang Ma, Zhengfeng Huang, Maoxiang Yi, Tian-Ming Ni, Yingchun Lu (2018). An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs. Asian Test Symposium.DOI
  157. Qian He, Ai-Bin Yan, Chaoping Lai, Yinlei Zhang, Chun-Ming Liu, Zhile Chen, Zhen Wu, Jie Cui, Huaguo Liang (2018). Novel low cost and DNU online self-recoverable RHBD latch design for nanoscale CMOS. International Symposium on Circuits and Systems.DOI
  158. Huaguo Liang, Xiang-Sheng Fang, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu (2018). A novel BIST scheme for circuit aging measurement of aerospace chips. Chinese Journal of Aeronautics.DOI
  159. Desong Pang, Dawen Xu, Ying Wang, Huaguo Liang (2018). MTTF-Aware Reliability Task Scheduling for PIM-Based Heterogeneous Computing System. International Test Conference in Asia.DOI
  160. Gaoliang Ma, Huaguo Liang, Liang Yao, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Kai Zhou (2018). A Low-Cost High-Efficiency True Random Number Generator on FPGAs. Asian Test Symposium.DOI
  161. 聂牧，梁华国，卞景昌，倪天明，徐秀敏，黄正峰（2017）. 基于硅通孔绑定后三维芯片测试调度优化方案. 《计算机工程与科学》.
  162. 胡必君，梁华国，易茂祥，许达文，徐秀敏（2017）. 一种改进的M-BUS主机接口电路的设计与仿真. 《电子技术应用》.
  163. 卞景昌，梁华国，聂牧，倪天明，徐秀敏，黄正峰（2017）. 基于改进CAF-WAS的绑定前硅通孔测试. 《计算机工程与科学》.
  164. 陈田，易鑫，王伟，刘军，梁华国，任福继（2017）. 一种低功耗双重测试数据压缩方案. 《电子学报》.
  165. 欧阳一鸣，孙成龙，李建华，梁华国，黄正峰，杜高明（2017）. 针对瞬时故障和间歇性故障的NoC链路容错方法. 《计算机研究与发展》.
  166. Yi-Ming Ouyang, Jian Da, Xiumin Wang, Qianqian Han, Huaguo Liang, Gao-Ming Du (2017). A TSV Fault-Tolerant Scheme Based on Failure Classification in 3D-NoC. J. Circuits Syst. Comput..DOI
  167. Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cui-Yun Jiang, Yingchun Lu, Ai-Bin Yan, Tian-Ming Ni, Maoxiang Yi (2017). A single event transient detector in SRAM-based FPGAs. IEICE Electronics Express.DOI
  168. Ai-Bin Yan, Huaguo Liang, Ying-Chun Lu, Zhengfeng Huang（2017）. 過渡パルスが二重フィルタリング可能で,オンライン自己回復型の,ラッチ.
  169. Qing Wu, Maoxiang Yi, Shi-Qi Yuan, Yao Zhang, Li Ding, Huaguo Liang (2017). Effective critical gate identification for mitigating circuit aging using gate replacement. IEEE International Conference on Electronic Measurement & Instruments.DOI
  170. Ai-Bin Yan, Huaguo Liang, Yingchun Lu, Zhengfeng Huang (2017). A transient pulse dually filterable and online self-recoverable latch. IEICE Electronics Express.DOI
  171. Yao Zhang, Maoxiang Yi, Ke-Ke Wang, Qing Wu, Li Ding, Huaguo Liang (2017). Multi-Vth technique based on potential critical paths for NBTI effect and leakage tradeoff. IEEE International Conference on Electronic Measurement & Instruments.DOI
  172. Tian-Ming Ni, Mu Nie, Huaguo Liang, Jing-Chang Bian, Xiumin Xu, Xiang-Sheng Fang, Zhengfeng Huang, Xiao-Qing Wen (2017). Vernier ring based pre-bond through silicon vias test in 3D ICs. IEICE Electronics Express.DOI
  173. Huaguo Liang, Xin Li, Zhengfeng Huang, Ai-Bin Yan, Xiumin Xu (2017). Highly Robust Double Node Upset Resilient Hardened Latch Design. IEICE transactions on electronics.DOI
  174. Ai-Bin Yan, Zhengfeng Huang, Maoxiang Yi, Jie Cui, Huaguo Liang (2017). HLDTL: High-performance, low-cost, and double node upset tolerant latch design. IEEE VLSI Test Symposium.DOI
  175. Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cui-Yun Jiang, Yi-Ming Ouyang, Xiang-Sheng Fang, Tian-Ming Ni, Maoxiang Yi (2017). A highly reliable butterfly PUF in SRAM-based FPGAs. IEICE Electronics Express.DOI
  176. Ai-Bin Yan, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Yi-Ming Ouyang, Huaguo Liang (2017). Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology. IEEE Transactions on Very Large Scale Integration (vlsi) Systems.DOI
  177. Tian-Ming Ni, Huaguo Liang, Mu Nie, Xiumin Xu, Ai-Bin Yan, Zhengfeng Huang (2017). A Region-Based Through-Silicon via Repair Method for Clustered Faults. IEICE transactions on electronics.DOI
  178. 欧阳一鸣，何鑫城，梁华国，易茂祥，杜高明，安鑫（2016）. 针对路径故障与局部拥塞的NoC容错路由算法. 《电子学报》.
  179. 欧阳一鸣，孙成龙，陈奇，梁华国，易茂祥，黄正峰，闫爱斌（2016）. 3D NoC关键通信部件容错方法研究综述. 《电子学报》.
  180. 闫爱斌，梁华国，黄正峰，蒋翠云，易茂祥（2016）. 考虑多时钟周期瞬态脉冲叠加的锁存窗屏蔽模型. 《电子学报》.
  181. 欧阳一鸣，王悄，梁华国，易茂祥，汪秀敏（2016）. NoC中相邻虚通道循环共享的VOQ容错路由器设计. 《计算机学报》.
  182. Maoxiang Yi, Xiaohong Liu, Qing Wu, Tian-Ming Ni, Zhengfeng Huang, Huaguo Liang (2016). NBTI mitigation by M-IVC with input duty cycle and randomness constraints. East-West Design & Test Symposium.DOI
  183. Ai-Bin Yan, Huaguo Liang, Zhengfeng Huang, Cui-Yun Jiang, Yi-Ming Ouyang, Xue-Jun Li (2016). An SEU resilient, SET filterable and cost effective latch in presence of PVT variations. Microelectronics and reliability.DOI
  184. Maoxiang Yi, Ying-Xian Gan, Zhengfeng Huang, Huaguo Liang (2016). Co-mitigating circuit PBTI and HCI aging considering NMOS transistor stacking effect. International Symposium on Intelligent Control.DOI
  185. Tian-Ming Ni, Dong-Sheng Liu, Qi Xu, Zhengfeng Huang, Huaguo Liang, Ai-Bin Yan (2016). Architecture of Cobweb-Based Redundant TSV for Clustered Faults. IEEE Transactions on Very Large Scale Integration (vlsi) Systems.DOI
  186. Ying-Xian Gan, Maoxiang Yi, Lin Zhang, Ye-Tao Yuan, Yi-Ming Ouyang, Huaguo Liang（2016）. 相乗とHCL老化効果を相乗的に緩和するための入力再編成方法【JST・京大機械翻訳】.
  187. Zheng-Feng Huang, Dong-Liang Qian, Huaguo Liang, Maoxiang Yi, Yi-Ming Ouyang, Ai-Bin Yan (2016). Single Event Hardening Latch Design in 65 nm Technology.
  188. Huaguo Liang, Xiumin Xu, Zhengfeng Huang, Cui-Yun Jiang, Yingchun Lu, Ai-Bin Yan, Tian-Ming Ni, Yi-Ming Ouyang, Maoxiang Yi (2016). A Methodology for Characterization of SET Propagation in SRAM-Based FPGAs. IEEE Transactions on Nuclear Science.DOI
  189. Tian Chen, Dandan Shen, Xin Yi, Huaguo Liang, Xiao-Qing Wen, Wei Wang (2016). Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures. IEICE Trans. Inf. Syst..DOI
  190. Ai-Bin Yan, Huaguo Liang, Zhengfeng Huang, Cui-Yun Jiang (2016). High-performance, low-cost, and highly reliable radiation hardened latch design.DOI
  191. Ai-Bin Yan, Zhengfeng Huang, Xiang-Sheng Fang, Xiao-Lin Xu, Huaguo Liang (2016). Novel Low Cost and Double Node Upset Tolerant Latch Design for Nanoscale CMOS Technology. Asian Test Symposium.DOI
  192. Ai-Bin Yan, Huaguo Liang, Zhengfeng Huang, Cui-Yun Jiang, Maoxiang Yi（2016）. マルチクロック周期過渡パルス重ね合わせを考慮した鎖存窗遮蔽モデル【JST・京大機械翻訳】.
  193. Ai-Bin Yan, Huaguo Liang, Xiao-L. Xu, De-Ran Yuan（2016）. ファンアウトの収束効果を考慮した組合せ回路のソフトエラー率評価【JST・京大機械翻訳】.
  194. Maoxiang Yi, Xiao-Hong Liu, Qing Wu, Tian-Ming Ni, Zheng-Feng Huang, Huaguo Liang（2016）. 入力デューティサイクルとランダムネス制約のあるMIVCによるNBTI緩和【Powered by NICT】.
  195. Yi-Ming Ouyang, Qi Chen, Xiumin Wang, Xiao-Ye Ouyang, Huaguo Liang, Gao-Ming Du (2016). AFTER: Asynchronous Fault-Tolerant Router Design in Network-on-Chip. J. Circuits Syst. Comput..DOI
  196. Aibin Yan, Xuejun Li, Zhao Lv, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang (2016). High performance, low cost, and double node upset tolerant latch design. HAL (Le Centre pour la Communication Scientifique Directe).
  197. 常郝，梁华国，蒋翠云，欧阳一鸣，徐辉（2015）. 一种3D堆叠集成电路中间绑定测试时间优化方案. 《电子学报》.
  198. 易茂祥，余成林，方祥圣，黄正峰，欧阳一鸣，梁华国（2015）. 并行折叠计数器状态向量选择生成. 《计算机研究与发展》.
  199. Guimao Zhang, Maoxiang Yi, Y. Miao, Dawen Xu, Huaguo Liang (2015). NBTI-induced circuit aging optimization by protectability-aware gate replacement technique. Latin American Test Symposium.DOI
  200. Xiao-Lin Xu, Song Jin, Huaguo Liang, Dandan Xu, Jun Yu Li (2015). On Enhancing Electromigration-Related Reliability of Heterogeneous MPSoC via Task Scheduling.
  201. Zhengfeng Huang, Huaguo Liang, S. Hellebrand (2015). A High Performance SEU Tolerant Latch. Journal of electronic testing.DOI
  202. Hao Chang, Huaguo Liang (2015). Pulse shrinkage based pre-bond through silicon vias test in 3D IC. IEEE VLSI Test Symposium.DOI
  203. Ai-Bin Yan, Huaguo Liang, Zhengfeng Huang, Cui-Yun Jiang, Maoxiang Yi (2015). A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology. IEICE transactions on electronics.DOI
  204. Maoxiang Yi, Chen-Ling Yu, Xiang-Sheng Fang, Zheng-Feng Huang, Yi-Ming Ouyang, Huaguo Liang (2015). State Vector Selective Generation of Parallel Folding Counters.DOI
  205. Huaguo Liang, Hao Chang, Yang Li, Wen Wang, Tian Chen, Hui Xu (2015). Optimized Mid-bond Order for 3D-Stacked ICs Considering Failed Bonding.DOI
  206. Huaguo Liang, Yangyang Dai, Maoxiang Yi, Dawen Xu, Zhengfeng Huang (2015). MTTF-Aware Reliability Task Scheduling for Heterogeneous Multicore System. International Conference on Algorithms and Architectures for Parallel Processing.DOI
  207. 李扬，梁华国，蒋翠云，常郝，易茂祥，方祥圣，杨彬（2014）. 选择序列的并行折叠计数器. 《计算机应用》.
  208. 邢璐，梁华国，严鲁明，张丽娜，余天送（2014）. 基于逻辑门类型的老化路径约减算法. 《计算机科学》.
  209. 欧阳一鸣，陈义军，梁华国，易茂祥，李建华（2014）. 一种故障通道隔离的低开销容错路由器设计. 《电子学报》.
  210. 欧阳一鸣，张一栋，梁华国，黄正峰，常郝（2014）. 基于虚通道故障粒度划分的3D NoC容错路由器设计. 《计算机研究与发展》.
  211. Jun Liu, Xi Wu, Huaguo Liang, Fuji Ren (2014). Optimizing the number of leaf nodes and TSVs in three dimen-sional scan tree.DOI
  212. Yi-Ming Ouyang, Yu Wang, Huaguo Liang, Zhengfeng Huang (2014). Building cluster-based 3D NoC with a weakening network stress method: Building cluster-based 3D NoC with a weakening network stress method.DOI
  213. Xi-Lei Huang, Maoxiang Yi, Lin Wang, Huaguo Liang (2014). Concurrent Core Test Based on Partial Test Set Reusing.DOI
  214. Yi-Ming Ouyang, Wu Yuan, Huaguo Liang, Tao Xie, Zhengfeng Huang (2014). Fault-tolerant design of redundant bidirectional TSV on 3D NoC: Fault-tolerant design of redundant bidirectional TSV on 3D NoC.DOI
  215. Huaguo Liang, Hui Xu, Zheng-Feng Huang, Maoxiang Yi (2014). A low-leakage and NBTI-mitigated N-type domino logic.DOI
  216. Huaguo Liang, Zhi Wang, Zhengfeng Huang, Ai-Bin Yan (2014). Design of a Radiation Hardened Latch for Low-Power Circuits. 2014 IEEE 23rd Asian Test Symposium.DOI
  217. Hao Chang, Huaguo Liang, Yang Li, Yi-Ming Ouyang (2014). Optimized stacking order for 3D-stacked ICs considering the probability and cost of failed bonding. Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test.DOI
  218. Jun Yu Li, Huaguo Liang, Dawen Xu, Song Jin (2014). Combination gate delay prediction considering NBTI hole trapping/detrapping mechanism.DOI
  219. Yi-Ming Ouyang, Yi-Dong Zhang, Huaguo Liang, Zhengfeng Huang, Hao Chang (2014). Design of Fault-Tolerant Router for 3D NoC Based on Virtual Channel Fault Granularity Partition.DOI
  220. 欧阳一鸣，张一栋，梁华国，黄正峰（2013）. 三维片上网络故障及拥塞感知的容错路由器设计. 《电子学报》.
  221. 欧阳一鸣，贺超，梁华国，黄正峰，谢涛（2013）. NoC架构下异构IP核的并行测试方法. 《电子学报》.
  222. Lu-Ming Yan, Huaguo Liang, Zhengfeng Huang (2013). A dynamic self-adaptive correction method for error resilient application. Design, Automation and Test in Europe.DOI
  223. Lu-Ming Yan, Huaguo Liang, Zhengfeng Huang (2013). Aging failure protection for integrated circuit based on spatio-temporal redundancy: Aging failure protection for integrated circuit based on spatio-temporal redundancy.DOI
  224. Yi-Ming Ouyang, Guilin Huang, Huaguo Liang, Tao Xie, Zhengfeng Huang (2013). Test data compression of system-on-chip (SoC) using few relevant bits: Test data compression of system-on-chip (SoC) using few relevant bits.DOI
  225. Lu-Ming Yan, Huaguo Liang, Zhengfeng Huang, Yan-Bin Liu (2013). A fault detection sensor for circuit aging using double-edge-triggered flip-flop.DOI
  226. Hui Xu, Huaguo Liang, Zhengfeng Huang, Hao Chang (2013). An improved aging-predict scheme based on symmetrical nor gate. Journal of Electronics (China).DOI
  227. 梁华国，李鑫，陈田，王伟，易茂祥（2012）. 并行折叠计数器的BIST方案. 《电子学报》.
  228. 刘杰，梁华国，易茂祥，赵发勇（2012）. 动态向量调整的多扫描链测试数据压缩. 《电子学报》.
  229. 陈田，梁华国，王伟，易茂祥，黄正峰（2012）. 基于优化编码的LFSR重播种测试压缩方案. 《计算机研究与发展》.
  230. 陈秀美，梁华国，黄正峰，吴珍妮，曹源（2012）. 一种交替互补的双状态机自恢复方案. 《计算机研究与发展》.
  231. 刘杰，梁华国，蒋翠云（2012）. 采用循环移位和优化编码的测试压缩方法. 《计算机研究与发展》.
  232. Tian Chen, Huaguo Liang, Wei Wang, Maoxiang Yi, Zhengfeng Huang (2012). A Test Compression Scheme Based on LFSR Reseeding and Optimized Coding.
  233. Huaguo Liang (2012). A function reuse based scan chain structure for error tolerance. Journal of Hefei University of Technology.
  234. Shu-Ying Yang, Chen-Fei Qin, Zhengfeng Huang, Huaguo Liang (2012). Soft Error and Aging Online Detection Based on Built-in Self Test.
  235. Jie Liu, Huaguo Liang, Cui-Yun Jiang (2012). Test Compression Approach of Adopting Cyclic Shift and Optimal Coding.
  236. Xiu-Mei Chen, Huaguo Liang, Zhengfeng Huang, Zhen-Ni Wu, Yuan Cao (2012). An Alternating-Complementary Self-Recovering Method Based on Dual FSMs.
  237. 梁华国，蒋翠云，罗强（2011）. 应用对称编码的测试数据压缩解压方法. 《计算机研究与发展》.
  238. 王杰，梁华国，李华伟，闵应骅，李晓维（2011）. 基于输出违例概率的时延向量测试质量评估. 《电子学报》.
  239. Huaguo Liang, Cui-Yun Jiang, Q. Luo (2011). Test Data Compression and Decompression Using Symmetry-Variable Codes.
  240. Yi-Ming Ouyang, Jun Liu, Huaguo Liang, Xi’e Huang (2011). Multiple scan chains compression method based on bit-transition compatibility: Multiple scan chains compression method based on bit-transition compatibility.DOI
  241. Yi-Ming Ouyang, Junwei Zhang, Huaguo Liang, Tao Xie (2011). Fault tolerant mechanism of the network on chip with the critical IP core strengthening: Fault tolerant mechanism of the network on chip with the critical IP core strengthening.DOI
  242. Jie Liu, Huaguo Liang (2011). Test of Multiple Scan Chain Grafting Using Test Vector Merging.
  243. Yi-Ming Ouyang, Bei Liu, Huaguo Liang (2011). Optimizing method for pre-bond test time on three-dimensional SoCs: Optimizing method for pre-bond test time on three-dimensional SoCs.DOI
  244. 王俊，梁华国，黄正峰，吴珍妮，秦晨飞（2010）. 一种对面积开销有效的组合逻辑选择性加固方案. 《计算机研究与发展》.
  245. 毛蔚，梁华国，程旺燕（2010）. 基于LFSR状态相关的测试数据压缩方法. 《网络安全与数据治理》.
  246. 吴珍妮，梁华国，黄正峰，陈秀美，曹源（2010）. 流水线电路的容错设计. 《网络安全与数据治理》.
  247. 吴义成，梁华国，李松坤，黄正峰，易茂祥（2010）. 一种基于自选择状态的折叠计数器BIST方案. 《计算机研究与发展》.
  248. 徐三子，梁华国，顾婉玉，刘杰（2010）. 基于无关位动态赋值的幂次划分测试压缩方案. 《计算机研究与发展》.
  249. 李松坤，梁华国，吴义成，易茂祥（2010）. 一种并行输出的折叠计数器方案. 《计算机研究与发展》.
  250. 顾婉玉，梁华国，徐三子（2010）. 一种基于响应中无关位填充的测试数据压缩方法. 《计算机研究与发展》.
  251. Huaguo Liang (2010). A time optimized test scheduling method under power constraint for NoC.
  252. Yi-Ming Ouyang, Baosheng Zou, Huaguo Liang, Xi’e Huang (2010). Test data compression of system-on-a-chip (SoC) based on partial runs reversing: Test data compression of system-on-a-chip (SoC) based on partial runs reversing.DOI
  253. Wen-Fa Zhan, Huaguo Liang, Cui-Yun Jiang, Zhengfeng Huang, A. El-Maleh (2010). A scheme of test data compression based on coding of even bits marking and selective output inversion. Computers & electrical engineering.DOI
  254. Huaguo Liang (2010). Design of Network-on-Chip Groupware Based on Hamming Code and Built-in Self-Test.
  255. Huaguo Liang (2010). Power priority test method of NoC communication architecture. Journal of Hefei University of Technology.
  256. Yi-Ming Ouyang, Xi’e Huang, Huaguo Liang, Baosheng Zou (2010). Test data compression technique based on partial data block reuse in SoC: Test data compression technique based on partial data block reuse in SoC.DOI
  257. Huaguo Liang (2010). Test Data Compression Based on Encoding Series and Alternation Sequences. Jisuanji gongcheng.
  258. Huaguo Liang (2010). An Optimization Mapping Method with Low Power for NoC. Microelectronics & Computer.
  259. Yi-Ming Ouyang, Kai Guo, Huaguo Liang (2010). Fault-Tolerant Communication Method for Network-on-Chip.
  260. Maoxiang Yi, Xueying Guo, Huaguo Liang, Wei Wang, Lei Zhang (2010). Core-unified soc test data compression and application.DOI
  261. Maoxiang Yi, Huaguo Liang, Lei Zhang, Wen-Fa Zhan (2010). A Novel $ {\rm x}$-ploiting Strategy for Improving Performance of Test Data Compression. IEEE Transactions on Very Large Scale Integration (VLSI) Systems.DOI
  262. 詹文法，梁华国，时峰，黄正峰（2009）. 一种混合定变长虚拟块游程编码的测试数据压缩方案. 《电子学报》.
  263. 孙科，梁华国，黄正峰，王伟（2009）. 一种基于三模冗余令牌的自恢复控制器. 《计算机应用》.
  264. 刘娟，欧阳一鸣，梁华国（2009）. 基于连续和交替序列编码的测试数据压缩. 《计算机工程》.
  265. Jie Liu, Huaguo Liang, San-San Xu (2009). Test data compression technology based on blocking code and optimal sort algorithm: Test data compression technology based on blocking code and optimal sort algorithm.DOI
  266. Huaguo Liang, Wang-Yan Cheng, Yang Li, Wei-zheng Mao (2009). LFSR reseeding method based on dividing test cubes by equal number of specified bits: LFSR reseeding method based on dividing test cubes by equal number of specified bits.DOI
  267. Huaguo Liang, Wen-Fa Zhan, Q. Luo, Cui-Yun Jiang (2009). A Test Vector Compression/Decompression Scheme Based on Logic Operation between Adjacent Bits (LOBAB) Coding. 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing.DOI
  268. Zhengfeng Huang, Huaguo Liang (2009). The Impact of MBUs on the Reliability of Rollback Recovery Circuits. 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis.DOI
  269. Zhengfeng Huang, Huaguo Liang (2009). A novel radiation hardened by design latch.DOI
  270. Maoxiang Yi, Huaguo Liang, Yi-Ming Ouyang, Bao-qing Wang, Cui-Yun Jiang, Wen-Fa Zhan, Zhengfeng Huang (2009). Exponent cut LFSR replanting VLSI test data compression method.
  271. Zhengfeng Huang, Huaguo Liang（2009）. 設計ラッチによる硬化新しい放射【Powered by NICT】.
  272. Huaguo Liang (2009). A SOC test method based on improved RAS architecture.
  273. Wen-Fa Zhan, Huaguo Liang, Feng Shi, Zhengfeng Huang (2009). A Test Data Compression Scheme Based on Mixed Fixed and Variable Length Coding: A Test Data Compression Scheme Based on Mixed Fixed and Variable Length Coding.DOI
  274. Yi-Ming Ouyang, Kai Guo, Huaguo Liang (2009). Weakening method for hot spot in communication of NoC: Weakening method for hot spot in communication of NoC.DOI
  275. Maoxiang Yi, Huaguo Liang, Kai-Hua Zhan, Cui-Yun Jiang (2009). Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing. 2009 International Conference on Computational Science and Engineering.DOI
  276. Maoxiang Yi, Huaguo Liang, Tian’en Chen (2009). Wrapper chain balance partition for cores based on best interchange decreasing: Wrapper chain balance partition for cores based on best interchange decreasing.DOI
  277. Jie Wang, Huawei Li, Y. Min, Xiaowei Li, Huaguo Liang (2009). Impact of Hazards on Pattern Selection for Small Delay Defects. 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing.DOI
  278. Ke Sun, Huaguo Liang, Zhengfeng Huang, Wei Wang (2009). Self-recovering controller based on TMR-token: Self-recovering controller based on TMR-token.DOI
  279. Yi-Ming Ouyang, Qian Yang, Huaguo Liang (2009). RAS Test Method Based on Data Compatibility Compress.
  280. Huaguo Liang (2009). Design and Simulation of NoC Routing Algorithm Based on 2D Mesh. Jisuanji gongcheng.
  281. 詹文法，梁华国，时峰，黄正峰（2008）. 混合定变长码的测试数据压缩方案. 《计算机学报》.
  282. 梁华国，祝沈财，陈田，张念（2008）. 基于RAS结构优化测试时间和数据量的测试方案. 《电子学报》.
  283. 詹文法，梁华国，时峰，黄正峰，欧阳一鸣（2008）. 一种共游程码的测试数据压缩方案. 《计算机研究与发展》.
  284. 欧阳一鸣，成丽丽，梁华国（2008）. 一种基于变长数据块相关性统计的测试数据压缩和解压方法. 《电子学报》.
  285. Tian Chen, Huaguo Liang, Min Zhang, Wei Wang (2008). A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter. International Conference for Young Computer Scientists.DOI
  286. Maoxiang Yi, Huaguo Liang, Zhengfeng Huang (2008). Balancing wrapper chains of SoC core based on best interchange decreasing. International Symposium on System-on-Chip.DOI
  287. Yiming Ouyang, Lili Cheng, Huaguo Liang (2008). Test data compression and decompression technique based on encoding sequential and non-continuous data blocks. Computer Engineering and Applications Journal.
  288. Zhengfeng Huang, Huaguo Liang (2008). A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies. 2008 14th IEEE International On-Line Testing Symposium.DOI
  289. Huaguo Liang (2008). A New Test Data Compression and Decompression Technique Based on Statistic Relativity of Variable Length Data Block. Dianzi xuebao.
  290. Huaguo Liang (2008). An optimized test ports selecting method under power constraint in NoC. Journal of Computer Applications.
  291. 梁华国，詹凯华，蒋翠云，易茂祥（2007）. 部分向量奇偶位切分的LFSR重新播种方法. 《计算机学报》.
  292. Wen-Fa Zhan, Huaguo Liang, Feng Shi, Zhengfeng Huang (2007). A Novel Collaborative Scheme of Test Data Compression Based on Fixed-Plus-variable-Length Coding. International Conference on Computer Supported Cooperative Work in Design.DOI
  293. Lei Zhang, Huaguo Liang, Wen-Fa Zhan, Cui-Yun Jiang (2007). Block Marking and Updating Coding in Test Data Compression for SoC. Asian Test Symposium.DOI
  294. Huaguo Liang, Maoxiang Yi, Wen-Fa Zhan, Jun Liu (2007). A multiple scan chain BIST scheme based on constraint input reduction.DOI
  295. Wen-Fa Zhan, Huaguo Liang, Feng Shi, Zhengfeng Huang (2007). Test data compression scheme based on variable-to-fixed-plus-variable-length coding. Journal of systems architecture.DOI
  296. Huaguo Liang (2007). Test Data Compression and Decompression Based on State Reversal Run Length Codes. Jisuanji gongcheng.
  297. Huaguo Liang (2007). Test Data Compression and Decompression Based on Co-prefixal Run-length Codes. Microelectronics & Computer.
  298. Huaguo Liang (2007). Concurrent test generation method based on multiple faults model. Computer Engineering and Applications Journal.
  299. 梁华国，方祥圣，蒋翠云，欧阳一鸣，易茂祥（2006）. 一种选择折叠计数状态转移的BIST方案. 《计算机研究与发展》.
  300. Xiang-Sheng Fang, Huaguo Liang (2006). BIST Scheme for Test Data Sharing with Multiple Cores.
  301. Huaguo Liang, Xiang-Sheng Fang, Cui-Yun Jiang, Yi-Ming Ouyang, Maoxiang Yi (2006). A BIST Scheme Based on Selecting State Transition of Folding Counters.DOI
  302. Huaguo Liang, Maoxiang Yi, Xiang-Sheng Fang, Cui-Yun Jiang (2005). A BIST Scheme Based on Selecting State Generation of Folding Counters. Asian Test Symposium.DOI
  303. 梁华国，蒋翠云（2004）. 基于交替与连续长度码的有效测试数据压缩和解压. 《计算机学报》.
  304. 梁华国，蒋翠云（2004）. 使用双重种子压缩的混合模式自测试. 《计算机研究与发展》.
  305. 陈卫兵，梁华国（2004）. 单片机系统RAM自检的改进. 《集成电路与嵌入式系统》.
  306. Huaguo Liang, Culyun Jiang (2003). Sharing BIST with multiple cores for system-on-a-chip. 2003 Test Symposium.DOI
  307. Huaguo Liang (2003). A new technique for deterministic scan based built in self test (BIST).
  308. Huaguo Liang, S. Hellebrand, H. Wunderlich (2002). A mixed-mode BIST scheme based on folding compression. Journal of Computational Science and Technology.DOI
  309. 梁华国，聚贝勒·海伦布昂特，汉斯-耶西姆·冯特利希（2001）. 一种基于折叠计数器重新播种的确定自测试方案. 《计算机研究与发展》.
  310. Huaguo Liang, S. Hellebrand, H. Wunderlich (2001). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. Proceedings International Test Conference 2001 (Cat. No.01CH37260).DOI
  311. S. Hellebrand, Huaguo Liang, H. Wunderlich (2000). A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).DOI
  312. 梁华国（1996）. 一种小型集散式控制系统通信接口电路. 《电子技术应用》.

预印本

  1. Zihao Miao, Huaguo Liang, Xin Li, Yingchun Lu, Liang Yao (2024). A Design of Lightweight True Random Number Generator Based on Galois Lfsr with Dynamic Feedback Path. SSRN Electronic Journal.DOI
  2. Maoxiang Yi, Zhengwen Liu, Yingchun Lu, Huaguo Liang (2024). A True Random Number Generator Based on Autonomous Boolean Network with Imbalanced Node Oscillation Rings. SSRN Electronic Journal.DOI
  3. Yiming Ouyang, Yihe Zhang, Huaguo Liang, Jianhua Li (2023). A Tree-Recursive Partitioned Multicast Mechanism for Noc Based Deep Neural Network Accelerator. SSRN Electronic Journal.DOI

研究方向

无线电电子学计算机软件及计算机应用电信技术

此主页由公开资料整理，尚未经学者本人认领。