Kuang Zhou, Zixin Zhang, Haoming Xu, Liang Wang, Yimin Shi (2026). Reliability Analysis Based on Evidential Likelihood for Uncertain Mixed Weibull Distribution. IEEE Transactions on Reliability.DOI
师义民(2025). 数理统计.
Jiaolong Wang, Fo-De Zhang, Keung Tony Ng, Yimin Shi (2025). Remaining Useful Life Prediction via Information Enhanced Domain Adversarial Generalization. IEEE Transactions on Reliability.DOI
Xiaolin Shi, Yimin Shi (2023). Estimation of stress-strength reliability for beta log Weibull distribution using progressive first failure censored samples. Quality And Reliability Engineering International, Vol. 390, No. 40.DOI
Xiaolin Shi, Yimin Shi, Qiankun Song (2022). Reliability analysis of J-out-of-N system with Nadarajah-Haghighi component under generalised progressive hybrid censoring. International Journal Of Systems Science, Vol. 530, No. 7.DOI
Bin Liu, Yimin Shi, Hon Keung Tony Ng, Xiangwen Shang (2021). Nonparametric Bayesian reliability analysis of masked data with dependent competing risks. Reliability Engineering & System Safety, Vol. 210.DOI
Liang Wang, Yogesh Mani Tripathi, Sanku Dey, Yimin Shi (2021). Inference for dependence competing risks with partially observed failure causes from bivariate Gompertz distribution under generalized progressive hybrid censoring. Quality And Reliability Engineering International, Vol. 370, No. 30.DOI
师义民(2021). 数理统计学习指导书.
Wang Liang, Ma Jin'ge, Shi Yimin (2020). Dependence Rayleigh competing risks model with generalized censored data. Journal Of Systems Engineering And Electronics, Vol. 310, No. 40.DOI
Fode Zhang, Hon Keung Tony Ng, Yimin Shi (2020). Mis-specification analysis of Wiener degradation models by using f-divergence with outliers. Reliability Engineering & System Safety, Vol. 195.DOI
Xuchao Bai, Yimin Shi, Yiming Liu, Chunfang Zhang (2020). Statistical inference for constant-stress accelerated life tests with dependent competing risks from Marshall-Olkin bivariate exponential distribution. Quality And Reliability Engineering International, Vol. 360, No. 20.DOI
Wang Yan, Shi Yimin, Wu Min (2019). Statistical inference for dependence competing risks model under middle censoring. Journal Of Systems Engineering And Electronics, Vol. 30, No. 1.DOI
Shi Xiaolin, Lu Pu, Shi Yimin (2018). Inference and optimal design on step-stress partially accelerated life test for hybrid system with masked data. Journal Of Systems Engineering And Electronics, Vol. 290, No. 50.DOI
Jing Cai, Yimin Shi, Bin Liu (2017). Statistical analysis for masked system life data from Marshall-Olkin Weibull distribution under progressive hybrid censoring. Naval Research Logistics, Vol. 640, No. 6.DOI
Liang Wang, Yimin Shi (2017). Estimation for constant-stress accelerated life test from generalized half-normal distribution. Journal Of Systems Engineering And Electronics, Vol. 280, No. 40.DOI
Chunfang Zhang, Yimin Shi (2017). Statistical prediction of failure times under generalized progressive hybrid censoring in a simple step-stress accelerated competing risks model. Journal Of Systems Engineering And Electronics, Vol. 280, No. 20.DOI
Min Wu, Yimin Shi, Yan Wang (2016). E-Bayesian estimation for competing risk model under progressively hybrid censoring. Journal Of Systems Engineering And Electronics, Vol. 270, No. 40.DOI
Liang Wang, Yimin Shi, Weian Yan (2016). Inference for Gompertz distribution under records. Journal Of Systems Engineering And Electronics, Vol. 270, No. 10.DOI
Song Mao, Yimin Shi, Liang Wang (2014). Exact inference for two exponential populations with competing risks data. Journal Of Systems Engineering And Electronics, Vol. 25, No. 4.DOI
Jiao Zhao, Yimin Shi, Weian Yan (2014). Inference for constant-stress accelerated life test with Type-I progressively hybrid censored data from Burr-XII distribution. Journal Of Systems Engineering And Electronics, Vol. 250, No. 20.DOI
Weian Yan, Yimin Shi, Baowei Song, Zhaoyong Mao (2011). Statistical analysis of generalized exponential distribution under progressive censoring with binomial removals. Journal Of Systems Engineering And Electronics, Vol. 22, No. 4.DOI