2026
Comprehensive Variation Model of Hafnium-Based Ferroelectric Capacitors for High-Sigma Memory Window Simulation
Diqing Su, Yannan Xu, Qingting Ding, Dongsen Chen, Shiqi Yue, Jianrui Cheng, Zhi-Wei Zheng, Hangbing Lv
IEEE Electron Device Letters
2026
IEEE Electron Device Letters
此主页由公开资料整理，尚未经学者本人认领。