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Real-time edge micro-defect detection for semiconductor wafers under complex backgrounds: a hybrid approach combining optical topography and deep learning
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Knowledge-Based Systems
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Composites. Part A, Applied science and manufacturing
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Small
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Polymer Composites
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Polymer
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Composites Science And Technology
2023
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Composite interfaces (Print)
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ACS Applied Nano Materials
2023
ACS Sustainable Chemistry & Engineering
2022
《传感技术学报》
2022
Composites Science And Technology
2022
Materials research bulletin
2021
China Automation Congress (CAC)
2021
China Automation Congress (CAC)
2021
ACS Applied Materials and Interfaces
2020
ACS Applied Materials and Interfaces
2020
Nanoscale
2020
2017
《无损检测》
2017
Journal of Signal Processing Systems
2017
IEEE International Conference on Cyber Security and Cloud Computing (CSCloud)
2012
《光谱学与光谱分析》
2012
PubMed
2011
《光谱学与光谱分析》
2011
《光谱学与光谱分析》
2011
《无损检测》
2010
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2010
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2009
《光谱学与光谱分析》
2008
《仪器仪表学报》
2005
《计算机测量与控制》
2002
《无损探伤》
2000
《黄河水利出版社》
2013
《第十三届全国光化学学术讨论会》
2011
2011 International Conference on Machine Intelligence(ICMI 2011 V4)
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