陈宇航｜中国科学技术大学｜学者主页

2026

Compact Snapshot Hyperspectral Imaging With Neural Dispersion‐Engineered Metalens

Peng Liu, Jiaru Chu, Yuhang Chen

Nanophotonics

DOI

2026

An inverse-magnetostrictive force sensor with optimized bias magnetic field configuration and signal conditioning

S. Su, Yuhang Chen

Sensors and Actuators A Physical

DOI

2025

基于编码器-解码器卷积神经网络的原子力显微镜针尖估计

雷艺彤，陈宇航

《仪器仪表学报》

DOI

2025

Adaptive sequential frequency excitation for efficient contact resonance atomic force microscopy

Mingchang Yang, Yuhang Chen

Measurement Science and Technology

DOI

2025

Multichannel Fusion Structured Light 3D Imaging Based on Metasurfaces

Peng Liu, Fan Xu, Jiaru Chu, Yuhang Chen

Laser & Photonics Review

DOI

2025

A chiral C4,z-symmetric metasurface for chromatic arbitrary linear polarization rotation

Wenjie Chen, Wenjie Chen, Fan Xu, Jiaru Chu, Yuhang Chen

Optics Communications

DOI

2024

Shear Anisotropy Domains on Graphene Revealed by In-Plane Elastic Imaging

Chengfu Ma, Yaping Li, Chenggang Zhou, Yuhang Chen, Enrico Gnecco, Jiaru Chu

ACS Nano

DOI

2024

Polarization-modulated dual-wavelength metalens to overcome the diffraction limit

Fan Xu, Peng Liu, Wenjie Chen, Ming Li, Yuhang Chen

Optics Communications

DOI

2024

Mechanical Mapping of Nanoblisters Confined by Two-Dimensional Materials Reveals Complex Ridge Patterns

Chengfu Ma, Xu Yang, Yuhang Chen, Jiaru Chu

Langmuir

DOI

2023

Analysis of mechanically tunable metasurfaces for identifying multiple strains

Ming Li, Wenjie Chen, Wenjie Chen, Peng Liu, Fan Xu, Yuhang Chen

Optics Communications

DOI

2023

Broadband achromatic and wide field-of-view single-layer metalenses in the mid-infrared

Fan Xu, Wenjie Chen, Ming Li, Peng Liu, Yuhang Chen

Optics Express

DOI

2023

Large‐scale time‐lapse scanning electron microscopy image mosaic using a smooth stitching strategy

Binglu Zhao, Kaidi Zhang, Peng Liu, Yuhang Chen

Microscopy Research and Technique

DOI

2023

Fabrication of a VO 2 -Based Tunable Metasurface by Electric-Field Scanning Probe Lithography with Precise Depth Control

Wenhao Zhang, Xiqi Wu, Liang Li, Chongwen Zou, Yuhang Chen

ACS Applied Materials & Interfaces

DOI

2023

Dual‐resonance sensing for environmental refractive index based on quasi‐BIC states in all‐dielectric metasurface

Wenjie Chen, Ming Li, Wenhao Zhang, Yuhang Chen

Nanophotonics

DOI

2023

Observation of intrinsic chiral bound states in the continuum

Yang Chen, Huachun Deng, Xinbo Sha, Weijin Chen, Ruize Wang, Yuhang Chen, Dong Qing Wu, Jiaru Chu, Yuri S. Kivshar, Shumin Xiao, Cheng‐Wei Qiu

Nature

DOI

2023

Time-Dependent Pinning of Nanoblisters Confined by Two-Dimensional Sheets. Part 2: Contact Line Pinning

Chengfu Ma, Yuhang Chen, Jiaru Chu

Langmuir

DOI

2023

Time-Dependent Pinning of Nanoblisters Confined by Two-Dimensional Sheets. Part 1: Scaling Law and Hydrostatic Pressure

Chengfu Ma, Yuhang Chen, Jiaru Chu

Langmuir

DOI

2023

Self-Coding Phase Shift for Absolute Phase Retrieval in Fringe Projection Profilometry

Peng Liu, Kaidi Zhang, Binglu Zhao, Ming Li, Yuhang Chen

IEEE Transactions on Instrumentation and Measurement

DOI

2022

Quantification of the dielectric constant of MoS2 and WSe2 Nanosheets by electrostatic force microscopy

Yaoping Hou, Guorui Wang, Chengfu Ma, Zhi Hua Feng, Yuhang Chen, Tobin Filleter

Materials Characterization

DOI

2022

Accurate determination of MFM tip’s magnetic parameters on nanoparticles by decoupling the influence of electrostatic force

Xiqi Wu, Wenhao Zhang, Wenting Wang, Yuhang Chen

Nanotechnology

DOI

2022

Reversible Nanomodulation of Thin Vanadium Dioxide Films by a Tip-Induced Electric Field

Wenhao Zhang, Xiqi Wu, Wenting Wang, Kaidi Zhang, Bowen Li, Yuhang Chen

ACS Applied Electronic Materials

DOI

2022

Linearizing the frequency‐stiffness relation in contact resonance atomic force microscopy for facilitated mechanical characterization

Wenting Wang, Wenhao Zhang, Yuhang Chen

Microscopy Research and Technique

DOI

2022

Efficient Adaptive Surface Measurement Based on Multilevel Gaussian Process Modeling and Scanning Path Optimization

Kaidi Zhang, Binglu Zhao, Wenhao Zhang, Xiqi Wu, Yuhang Chen

IEEE Transactions on Instrumentation and Measurement

DOI

2021

Measurement of Film–Elastomer Interface Adhesion by Continuous Buckling

Wenting Wang, Wenhao Zhang, Xiqi Wu, Kaidi Zhang, Yuhang Chen

ACS Applied Materials & Interfaces

DOI

2021

A three-dimensional surface measurement system implemented with Gaussian process based adaptive sampling

Kaidi Zhang, Wenting Wang, Binglu Zhao, Yuhang Chen

Precision Engineering

DOI

2021

Thermal noise in contact atomic force microscopy

Chengfu Ma, Chenggang Zhou, Jinlan Peng, Yuhang Chen, Walter Arnold, Jiaru Chu

Journal of Applied Physics

DOI

2021

Environmental temperature effect on dimensional measurements of atomic force microscopy

Chengfu Ma, Yuhang Chen, Wenhao Huang

Nanotechnology and Precision Engineering

DOI

2021

Multifunctional cantilevers for simultaneous enhancement of contact resonance and harmonic atomic force microscopy

Wenting Wang, Kaidi Zhang, Wenhao Zhang, Yaoping Hou, Yuhang Chen

Nanotechnology

DOI

2021

Double-layer metalens with a reduced meta-atom aspect ratio

Zan Yao, Wenjie Chen, Yuhang Chen

Optics Letters

DOI

2021

A dual-use probe for nano-metric photoelectric characterization using a confined light field generated by photonic crystals in the cantilever

Yaoping Hou, Chengfu Ma, Wenting Wang, Yuhang Chen

Nano Research

DOI

2021

Focusing and imaging of a polarization-controlled bifocal metalens

Zan Yao, Yuhang Chen

Optics Express

DOI

2021

Detection of ion implantation in focused ion beam processing by scattering-type scanning near-field optical microscopy

Wenhao Zhang, Kaidi Zhang, Wenting Wang, Yuhang Chen

Optics Letters

DOI

2020

Measurement of undercut etching by contact resonance atomic force microscopy

Wenting Wang, Chengfu Ma, Yuhang Chen

Applied Physics Letters

DOI

2020

Enhancement of contact resonance atomic force microscopy subsurface imaging by mass-attached cantilevers

Wenting Wang, Wenhao Zhang, Yuhang Chen

Journal of Physics D Applied Physics

DOI

2020

Visibility of subsurface nanostructures in scattering-type scanning near-field optical microscopy imaging

Wenhao Zhang, Yuhang Chen

Optics Express

DOI

2019

Depth-sensing using AFM contact-resonance imaging and spectroscopy at the nanoscale

Chengfu Ma, Weiheng Wang, Yuhang Chen, Walter Arnold, Jiaru Chu

Journal of Applied Physics

DOI

2019

Binary coded cantilevers for enhancing multi-harmonic atomic force microscopy

Yaoping Hou, Chengfu Ma, Wenting Wang, Yuhang Chen

Sensors and Actuators A Physical

DOI

2019

Contrast Mechanism of Ultrasonic-based Atomic Force Microscopy for Subsurface Imaging

Chengfu Ma, Yuhang Chen, Walter Arnold

IEEE International Ultrasonics Symposium

DOI

2019

Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensing

Weijie Zhang, Yuhang Chen, Yaoping Hou, Wenting Wang, Huarong Liu, Lei Zheng

Ultramicroscopy

DOI

2019

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

Wenting Wang, Chengfu Ma, Yuhang Chen, Lei Zheng, Huarong Liu, Jiaru Chu

Beilstein Journal of Nanotechnology

DOI

2019

Metasurface-enhanced optical lever sensitivity for atomic force microscopy

Zan Yao, Xicheng Xia, Yaoping Hou, Peng Zhang, Xiaomin Zhai, Yuhang Chen

Nanotechnology

DOI

2018

Subsurface imaging of cavities in liquid by higher harmonic atomic force microscopy

Weijie Zhang, Yuhang Chen, Huarong Liu, Lei Zheng

Applied Physics Letters

DOI

2018

Stick-to-sliding transition in contact-resonance atomic force microscopy

Chengfu Ma, V. Pfahl, Zheng Wang, Yuhang Chen, Jiaru Chu, M. Kalyan Phani, Anish Kumar, Walter Arnold, Konrad H. Samwer

Applied Physics Letters

DOI

2018

Space-filling scan paths and Gaussian process-aided adaptive sampling for efficient surface measurements

Chengfei Yang, Chaoyang Peng, Yuhang Chen, Tingting Luo, Jiaru Chu

Precision Engineering

DOI

2017

Sub-surface AFM imaging using tip generated stress and electric fields

Maria Jose Cadena, Yuhang Chen, Ronald G. Reifenberger, Arvind Raman

Applied Physics Letters

DOI

2017

Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

Weijie Zhang, Yuhang Chen, Xicheng Xia, Jiaru Chu

Beilstein Journal of Nanotechnology

DOI

2017

Note: Double-hole cantilevers for harmonic atomic force microscopy

Weijie Zhang, Yuhang Chen, Jiaru Chu

Review of Scientific Instruments

DOI

2017

Intelligent adaptive sampling guided by Gaussian process inference

Yuhang Chen, Chaoyang Peng

Measurement Science and Technology

DOI

2017

Detection of subsurface cavity structures using contact-resonance atomic force microscopy

Chengfu Ma, Yuhang Chen, Walter Arnold, Jiaru Chu

Journal of Applied Physics

DOI

2017

Bridged Bowtie Aperture Antenna for Producing an Electromagnetic Hot Spot

Yang Chen, Yuhang Chen, Jiaru Chu, Xianfan Xu

ACS Photonics

DOI

2017

Cantilever optimization for applications in enhanced harmonic atomic force microscopy

Weijie Zhang, Yuhang Chen, Jiaru Chu

Sensors and Actuators A Physical

DOI

2016

基于开尔文探针力显微镜的纳米复合材料次表面成像分析

熊晓洋，陈宇航

Nanotechnology and Precision Engineering

2016

Measuring stiffness and residual stress of thin films by contact resonance atomic force microscopy

Chengfu Ma, Yuhang Chen, Jianfeng Chen, Jiaru Chu

Applied Physics Express

DOI

2016

Visualizing subsurface defects in graphite by acoustic atomic force microscopy

Tian Wang, Chengfu Ma, Wei Hu, Yuhang Chen, Jiaru Chu

Microscopy Research and Technique

DOI

2016

Data fusion for accurate microscopic rough surface metrology

Yuhang Chen

Ultramicroscopy

DOI

2015

Improving dimensional measurement from noisy atomic force microscopy images by non‐local means filtering

Yuhang Chen

Scanning

DOI

2015

Atomic force microscopy force‐distance curves with small amplitude ultrasonic modulation

Chengfu Ma, Yuhang Chen, Tian Wang, Jiaru Chu

Scanning

DOI

2015

Effects of temperature and humidity on atomic force microscopy dimensional measurement

Tian Wang, Chengfu Ma, Yuhang Chen, Jiaru Chu, Wenhao Huang

Microscopy Research and Technique

DOI

2015

Image contrast reversals in contact resonance atomic force microscopy

Chengfu Ma, Yuhang Chen, Tian Wang

AIP Advances

DOI

2014

Analysis and correction of drift-induced distortions on quantitative SPM surface roughness evaluations

Tingting Luo, Yuhang Chen, Wenhao Huang, Sitian Gao

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI

2014

Displacement measurement with nanoscale resolution using a coded micro-mark and digital image correlation

Wei Huang, Chengfu Ma, Yuhang Chen

Optical Engineering

DOI

2014

Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy

Yuhang Chen, Tingting Luo, Chengfu Ma, Wenhao Huang, Sitian Gao

Microscopy and Microanalysis

DOI

2014

Focused Ion Beam Fabrication and Atomic Force Microscopy Characterization of Micro/Nanoroughness Artifacts With Specified Statistic Quantities

Yuhang Chen, Tingting Luo, Wenhao Huang

IEEE Transactions on Nanotechnology

DOI

2013

An improved method for computer generation of three-dimensional digital holography

Yanlei Hu, Jianqiang Ma, Yuhang Chen, Jiawen Li, Wenhao Huang, Jiaru Chu

Journal of Optics

DOI

2013

High-efficiency fabrication of aspheric microlens arrays by holographic femtosecond laser-induced photopolymerization

Yanlei Hu, Yuhang Chen, Jianqiang Ma, Jiawen Li, Wenhao Huang, Jiaru Chu

Applied Physics Letters

DOI

2013

Fabrication and characterization of areal roughness specimens for applications in scanning probe microscopy

Yuhang Chen, Xiangchao Zhang, Tingting Luo, Xiaoning Liu, Wenhao Huang

Measurement Science and Technology

DOI

2013

Design and laser fabrication of controllable non-Gaussian roughness surfaces at microscale

Tingting Luo, Xiaoning Liu, Yuhang Chen, Wenhao Huang, Zhe Liu

Applied Surface Science

DOI

2013

A comparative experimental study on sample excitation and probe excitation in force modulation atomic force microscopy

Chunlai Yang, Yuhang Chen, Tian Wang, Wenhao Huang

Measurement Science and Technology

DOI

2012

Femtosecond laser induced surface deformation in multi-dimensional data storage

Yanlei Hu, Yuhang Chen, Jiawen Li, Daqiao Hu, Jiaru Chu, Qijin Zhang, Wenhao Huang

Applied Physics Letters

DOI

2012

Optimal design and fabrication of three-dimensional calibration specimens for scanning probe microscopy

Xiaoning Liu, Tingting Luo, Yuhang Chen, Wenhao Huang, Guido Piaszenski

Review of Scientific Instruments

DOI

2012

Topographic Contrast in Force Modulation Atomic Force Microscopy Images

Chunlai Yang, Cheng Zheng, Yuhang Chen, Wenhao Huang

Japanese Journal of Applied Physics

DOI

2011

Influence of microstructure-confined fluids on the atomic force microscope probe dynamics

Yuhang Chen, Dun Niu, Wenhao Huang

Micro & Nano Letters

DOI

2011

Tunable structural colour on the basis of colloidal crystal

Jiawen Li, Qi Han, Yuhang Chen, Jiaru Chu, Wenhao Huang

Micro & Nano Letters

DOI

2011

Methods for Vertical Drift Measurements of Scanning Probe Microscopes

Dun Niu, Yuhang Chen, Wenhao Huang

Analytical Sciences

DOI

2011

Effect of tunable structural color caused by colloidal crystal

Jiawen Li, Ping Du, Xi Li, Yuhang Chen, Wenhao Huang

IEEE International Conference on Nano/Micro Engineered and Molecular Systems

DOI

2010

用于单电子自旋探测微悬臂梁的制作及端头磁针尖设计

刘勇，赵钢，陈宇航，孔雯，褚家如

《传感技术学报》

2010

Optimization of Zero-Reference Grating Considering Tip Distortions for Scanning Probe Microscopy Drift Measurement

Yuhang Chen, Wenhao Huang

Journal of Nanoscience and Nanotechnology

DOI

2010

Comparative study on the nonperiodic and periodic gratings for scanning probe microscopy drift measurements

Dun Niu, Jiawen Li, Yuhang Chen, Wenhao Huang

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

DOI

2010

Size and mass loading effect on quality factor of single-crystal silicon cantilever in atmosphere

Yong Liu, Gang Zhao, Yuhang Chen, Jiaru Chu

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI

2010

Dynamics of an atomic force microscope probe in liquid investigated via three-dimensional mode

Dun Niu, Yuhang Chen, Wenhao Huang

Measurement Science and Technology

DOI

2010

Mechanism and analysis of structural color in two typical butterfly scales

Jiawen Li, Xi Li, Fei Yu, Yuhang Chen, Wenhao Huang

IEEE International Conference on Nano/Micro Engineered and Molecular Systems

DOI

2009

AFM非线性测量的影响因素分析

李家文，李佳，陈宇航，黄文浩

《电子显微学报》

2009

纳米压痕中针尖效应的分析

张天林，陈宇航，黄文浩，王翔

Journal of University of Science and Technology of China

2009

Two-photon-induced polarization-multiplexed and multilevel storage in photoisomeric copolymer film

Yanlei Hu, Zhoushun Zhang, Yuhang Chen, Qijin Zhang, Wenhao Huang

Optics Letters

DOI

2009

Influences of Geometrical Factors on Quantitative Surface Roughness Evaluations by Atomic Force Microscopy

Yuhang Chen, Wenhao Huang

Journal of Nanoscience and Nanotechnology

DOI

2007

基于原子力显微镜的PMMA飞秒激光纳米加工

黄文浩，朱兰芳，陈宇航，言峰，周明，王翔

《光学精密工程》

2007

扫描探针显微镜漂移的定量测量方法

陈宇航，黄文浩

《中国科学技术大学学报》

2007

AFM扫描参数对表面粗糙度测量的影响分析

李家文，陈宇航，黄文浩

《电子显微学报》

2007

Application of a novel nonperiodic grating in scanning probe microscopy drift measurement

Yuhang Chen, Wenhao Huang

Review of Scientific Instruments

DOI

2007

Some issues on atomic force microscopy based surface characterization

Yuhang Chen, Wenhao Huang

Optoelectronics Letters

DOI

2006

原子力显微镜测量双光子成型点的弹性模量

苏亚辉，陈宇航，董磊，郑志军，郭锐，肖诗洲，黄文浩

《光学精密工程》

2006

用有限元法计算飞秒激光双光子成型点弹性模量

苏亚辉，郭锐，董磊，陈宇航，肖诗洲，黄文浩

Nanotechnology and Precision Engineering

2005

飞秒激光双光子成型点弹性模量测量与分析

苏亚辉，郭锐，董磊，郑志军，陈宇航，肖诗洲，黄文浩

《微细加工技术》

2005

Alignment measurement of two-dimensional zero-reference marks

Zhou Cheng-gang, Yingnan Wang, Yuhang Chen, Huang Wenhao

Precision Engineering

DOI

2004

基于SPM技术的表面纳米计量

黄文浩，陈宇航，党学明

《微纳电子技术》

2004

Numerical simulation of the geometrical factors affecting surface roughness measurements by AFM

Yuhang Chen, Wenhao Huang

Measurement Science and Technology

DOI

2004

Analysis of vibrating mode scanning polarization force microscope

Yuhang Chen, Xiaojun Li, Xingfei Zhou, Jielin Sun, Wenhao Huang, Jun Hu

Review of Scientific Instruments

DOI

2003

纳米颗粒填充的PTFE微结构的原子力显微镜测量

党学明，陈宇航，乐启发，张成德，黄文浩

《电子显微学报》

2003

Design and analysis of two-dimensional zero-reference marks for alignment systems

Yuhang Chen, Wenhao Huang, Xueming Dang

Review of Scientific Instruments

DOI

2002

Diffraction-based analysis of effects of fabricating and installation errors on a nano-alignment system

Yuhang Chen, Wenhao Huang

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI

2001

SPM图像模拟、表面重建及探针估计

陈宇航，黄文浩，鲁健，党学明

《电子显微学报》

2001

原子力显微镜在金刚石表面微结构分析中的应用

黄文浩，张竟敏，阎立峰，陈宇航，褚家如

《电子显微学报》

精选作品

期刊论文

Compact Snapshot Hyperspectral Imaging With Neural Dispersion‐Engineered Metalens

An inverse-magnetostrictive force sensor with optimized bias magnetic field configuration and signal conditioning

基于编码器-解码器卷积神经网络的原子力显微镜针尖估计

Adaptive sequential frequency excitation for efficient contact resonance atomic force microscopy

Multichannel Fusion Structured Light 3D Imaging Based on Metasurfaces

A chiral C4,z-symmetric metasurface for chromatic arbitrary linear polarization rotation

Shear Anisotropy Domains on Graphene Revealed by In-Plane Elastic Imaging

Polarization-modulated dual-wavelength metalens to overcome the diffraction limit

Mechanical Mapping of Nanoblisters Confined by Two-Dimensional Materials Reveals Complex Ridge Patterns

Analysis of mechanically tunable metasurfaces for identifying multiple strains

Broadband achromatic and wide field-of-view single-layer metalenses in the mid-infrared

Large‐scale time‐lapse scanning electron microscopy image mosaic using a smooth stitching strategy

Fabrication of a VO 2 -Based Tunable Metasurface by Electric-Field Scanning Probe Lithography with Precise Depth Control

Dual‐resonance sensing for environmental refractive index based on quasi‐BIC states in all‐dielectric metasurface

Observation of intrinsic chiral bound states in the continuum

Time-Dependent Pinning of Nanoblisters Confined by Two-Dimensional Sheets. Part 2: Contact Line Pinning

Time-Dependent Pinning of Nanoblisters Confined by Two-Dimensional Sheets. Part 1: Scaling Law and Hydrostatic Pressure

Self-Coding Phase Shift for Absolute Phase Retrieval in Fringe Projection Profilometry

Quantification of the dielectric constant of MoS2 and WSe2 Nanosheets by electrostatic force microscopy

Accurate determination of MFM tip’s magnetic parameters on nanoparticles by decoupling the influence of electrostatic force

Reversible Nanomodulation of Thin Vanadium Dioxide Films by a Tip-Induced Electric Field

Linearizing the frequency‐stiffness relation in contact resonance atomic force microscopy for facilitated mechanical characterization

Efficient Adaptive Surface Measurement Based on Multilevel Gaussian Process Modeling and Scanning Path Optimization

Measurement of Film–Elastomer Interface Adhesion by Continuous Buckling

A three-dimensional surface measurement system implemented with Gaussian process based adaptive sampling

Thermal noise in contact atomic force microscopy

Environmental temperature effect on dimensional measurements of atomic force microscopy

Multifunctional cantilevers for simultaneous enhancement of contact resonance and harmonic atomic force microscopy

Double-layer metalens with a reduced meta-atom aspect ratio

A dual-use probe for nano-metric photoelectric characterization using a confined light field generated by photonic crystals in the cantilever

Focusing and imaging of a polarization-controlled bifocal metalens

Detection of ion implantation in focused ion beam processing by scattering-type scanning near-field optical microscopy

Measurement of undercut etching by contact resonance atomic force microscopy

Enhancement of contact resonance atomic force microscopy subsurface imaging by mass-attached cantilevers

Visibility of subsurface nanostructures in scattering-type scanning near-field optical microscopy imaging

Depth-sensing using AFM contact-resonance imaging and spectroscopy at the nanoscale

Binary coded cantilevers for enhancing multi-harmonic atomic force microscopy

Contrast Mechanism of Ultrasonic-based Atomic Force Microscopy for Subsurface Imaging

Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensing

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

Metasurface-enhanced optical lever sensitivity for atomic force microscopy

Subsurface imaging of cavities in liquid by higher harmonic atomic force microscopy

Stick-to-sliding transition in contact-resonance atomic force microscopy

Space-filling scan paths and Gaussian process-aided adaptive sampling for efficient surface measurements

Sub-surface AFM imaging using tip generated stress and electric fields

Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

Note: Double-hole cantilevers for harmonic atomic force microscopy

Intelligent adaptive sampling guided by Gaussian process inference

Detection of subsurface cavity structures using contact-resonance atomic force microscopy

Bridged Bowtie Aperture Antenna for Producing an Electromagnetic Hot Spot

Cantilever optimization for applications in enhanced harmonic atomic force microscopy

基于开尔文探针力显微镜的纳米复合材料次表面成像分析

Measuring stiffness and residual stress of thin films by contact resonance atomic force microscopy

Visualizing subsurface defects in graphite by acoustic atomic force microscopy

Data fusion for accurate microscopic rough surface metrology

Improving dimensional measurement from noisy atomic force microscopy images by non‐local means filtering

Atomic force microscopy force‐distance curves with small amplitude ultrasonic modulation

Effects of temperature and humidity on atomic force microscopy dimensional measurement

Image contrast reversals in contact resonance atomic force microscopy

Analysis and correction of drift-induced distortions on quantitative SPM surface roughness evaluations

Displacement measurement with nanoscale resolution using a coded micro-mark and digital image correlation

Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy

Focused Ion Beam Fabrication and Atomic Force Microscopy Characterization of Micro/Nanoroughness Artifacts With Specified Statistic Quantities

An improved method for computer generation of three-dimensional digital holography

High-efficiency fabrication of aspheric microlens arrays by holographic femtosecond laser-induced photopolymerization

Fabrication and characterization of areal roughness specimens for applications in scanning probe microscopy

Design and laser fabrication of controllable non-Gaussian roughness surfaces at microscale

A comparative experimental study on sample excitation and probe excitation in force modulation atomic force microscopy

Femtosecond laser induced surface deformation in multi-dimensional data storage

Optimal design and fabrication of three-dimensional calibration specimens for scanning probe microscopy

Topographic Contrast in Force Modulation Atomic Force Microscopy Images

Influence of microstructure-confined fluids on the atomic force microscope probe dynamics

Tunable structural colour on the basis of colloidal crystal

Methods for Vertical Drift Measurements of Scanning Probe Microscopes

Effect of tunable structural color caused by colloidal crystal

用于单电子自旋探测微悬臂梁的制作及端头磁针尖设计

Optimization of Zero-Reference Grating Considering Tip Distortions for Scanning Probe Microscopy Drift Measurement

Comparative study on the nonperiodic and periodic gratings for scanning probe microscopy drift measurements